Abstract:Process variations during manufacturing lead to differences in the performance of the chips. In order to better utilize the performance of the chips, it is necessary to perform maximum operation frequency (Fmax) tests to place the chips into different speed bins. For most Fmax tests, significant efforts are put in place to reduce test cost and improve binning accuracy; e.g., our conference paper published in ICICM 2017 presents a novel binning sensor for low-cost and accurate speed binning. However, by promoti… Show more
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