2012
DOI: 10.1109/tim.2011.2172116
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On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations

Abstract: page number: 12International audienceWith the growing concerns about electromagnetic compatibility of integrated circuits, the need for accurate prediction tools and models to reduce risks of non-compliance becomes critical for circuit designers. However, on-chip characterization of noise is still necessary for model validation and design optimization. Although different on-chip measurement solutions have been proposed for emission issue characterization, no on-chip measurement methods have been proposed to ad… Show more

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Cited by 33 publications
(3 citation statements)
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“…The resolution of the measurement instrument is a critical consideration for a high-accurate measurement for the circuit, our experimental setup can provide a high-resolution thanks to its resolution of up to 100 uV per division. Noise reduction is another critical consideration in the field of measurement [ 29 , 30 , 31 , 32 , 33 ]. A clean target signal without significant noise interference can improve the measurement, thereby obtaining a reliable evaluation on the circuit.…”
Section: A Measurement-verified Perceptron Chipmentioning
confidence: 99%
“…The resolution of the measurement instrument is a critical consideration for a high-accurate measurement for the circuit, our experimental setup can provide a high-resolution thanks to its resolution of up to 100 uV per division. Noise reduction is another critical consideration in the field of measurement [ 29 , 30 , 31 , 32 , 33 ]. A clean target signal without significant noise interference can improve the measurement, thereby obtaining a reliable evaluation on the circuit.…”
Section: A Measurement-verified Perceptron Chipmentioning
confidence: 99%
“…On-chip parametric sensing has been an important field of advancement, providing diverse and concrete support for feeding back the physical parameters needed by any runtime management scheme. In addition to detecting threshold crossing using voltage and thermal sensors to trigger simple actions such as throttling [26], it's also possible to sense a wider range of parameters including current/power [17], process variations [20], supply noise [4], voltage drop [23], transistor ageing [30] and electromagnetic induction [10]. More recently, reference-free sensing techniques have also been developed which would support better sensing under uncertain operating conditions, especially when no high-quality references can be had in terms of voltage, current or frequency [25].…”
Section: Introductionmentioning
confidence: 99%
“…However, current on-chip measurement techniques are not suitable for measuring the 2D on-chip EMI distribution in real time. Some techniques store the measured signals first and then read out them afterwards (1)(2)(3)(4)(5) (6).…”
Section: Introductionmentioning
confidence: 99%