On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology

This paper presents a measurement circuit structure for capturing SET pulse-width suppressing pulse-width modulation and within-die process variation effects. For mitigating pulse-width modulation while maintaining area efficiency, the proposed circuit uses massively parallelized short inverter chains as a target circuit. Moreover, for each inverter chain on each die, pulse-width calibration is performed. In measurements, narrow SET pulses ranging 5 ps to 215 ps were obtained. We confirm that an overestimation of pulse-width may happen when ignoring die-to-die and within-die variation of the measurement circuit. Our evaluation results thus point out that calibration for within-die variation in addition to die-to-die variation of the measurement circuit is indispensable. key words: soft error, single event transient (SET), pulse-width, pulsewidth modulation, measurement circuit, within-die process variation Ryo Harada (S'09) received the B.E. and M.E. degrees in Information Systems Engineering from Osaka University, Osaka, Japan, in 2009. He is currently pursuing the Ph.D. degree in the Department of Information Systems Engineering at Osaka University. His research interests include soft error estiomation. Yukio Mitsuyama received B.E., M.E., and Ph.D. degrees in Information Systems Engineering from Osaka University, Japan, in 1998, 2000, and 2010, respectively. He is currently an Associate Professor in School of Engineering, Kochi University of Technology. His research interests include reconfigurable architecture and its VLSI design. He is a member of IEEE and IPSJ. sity. His research interest includes computeraided design for digital integrated circuits, and high speed and low power circuit design. Dr. Hashimoto served on the technical program committees for international conferences including DAC, ICCAD, ITC, Symposium on VLSI Circuits, ASP-DAC, DATE, and ISPD. He is a member of IEEE, ACM and IPSJ. Takao Onoye received the B.E. and M.E. degrees in Electronic Engineering, and Dr.Eng. degree in Information Systems Engineering all from Osaka University, Japan, in 1991Japan, in , 1993Japan, in , and 1997. He is currently a professor in the Department of Information Systems Engineering, Osaka University. His research interests include media-centric low-power architecture and its SoC implementation. He is a member of IEEE, IPSJ, and ITE-J.

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“…† Similar parallelization for SET pulse-width measurement is reported in[5], but a preliminary work of this paper[6] was published before[5].…”

mentioning

confidence: 80%

SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects

Harada

Mitsuyama

Hashimoto

et al. 2014

IEICE Trans. Fundamentals

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“…The SET is a momentary voltage spike at a node of an integrated circuit generated by a single energetic particle passing through or near the junctions creating an ionization track. As illustrated in Figure 2.9, the peak voltage affects non-latched elements such as combinational logic (LOVELESS et al, 2012). The resulting effect may propagate any significant distance through the combinational logic and, if it is not masked, can reach a memory element where can be sampled causing a fault (WIRTH;…”

Section: Soft Errorsmentioning

confidence: 99%

Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-Constrained IoT Edge Devices

Abich¹,

Ost²,

Reis³

2023

Synthesis Lectures on Engineering, Science, and Technology

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You may never know what results come from your action, but if you do nothing there will be no results." -Mahatma Gandhi AGRADECIMENTOS Agradeço a Deis em primeiro lugar por me acompanhar em todos os momentos da minha vida, principalmente durante as dificuldades. A família é a principal estrutura na vida de um grande homem e a minha está sempre ao meu lado. Agradeço a meus pais CARLOS ALBERTO DORNELLES ABICH, vulgo Dornellão, e ELANE ABICH, minha mãe, por me ensinar que com trabalho duro, respeito, dignidade e caráter se atinge qualquer objetivo. Vocês literalmente fizeram um baita doutor. PAULA ANDRESSA FISCHER, toda vez que eu preciso falar de ti eu sinto que fui abençoado em te ter ao meu lado. Se pudesse desejar algo melhor para esse mundo, desejaria que existissem mais pessoas como você. Só nós sabemos o que passamos nestes últimos anos. Obrigado por existir, e obrigado por estar ao meu lado, sempre, independente dos obstáculos que temos no nosso caminho. A tua compania da mais sentido a minha trajetória. Com esta conquista, até que enfim tu vai poder casar... Te amo. Caros RICARDO AUGUSTO DA LUZ REIS e LUCIANO COPELLO OST, haja insistência, paciência e café comigo né! Mas vamos aos fatos. À quem ler este pedaço da tese, entenda que essas duas pessoas são incríveis. Não estou falando de curriculo e parte técnica. O Reis é meu segundo pai, literalmente, acho que a admiração que um filho tem por um pai ja é o suficiente para exemplificar o que eu sinto. Ost, é como um irmão mais experiênte (pra não dizer mais velho), que sempre buscou que eu não cometesse os mesmos erros que ele, que eu evoluisse a cada passo, que me dava a mão para levantar a cada tropeço e um pontapé para não ficar resmungando ao invés de trabalhar. Sem contar as viagens, os 20 dias que passei com o Ost em Leicester e os churrascos do grupo. Obrigado por tudo isso. Agora vamos além! Aos colegas de laboratório. O RAFAEL FRAGA GARIBOTTI, obrigado pelos auxilios nos artigos e pelas conversas, certamente me esclareceram muita coisa com tua experiência de vida profissional e de estudos. JONAS FOGLIARINI GAVA, e sua paciência, valeu pelos auxilios nos artigos e pela parceria. O MATEUS PAIVA FOGAÇA, meu irmão de pós graduação, obrigado pela amizade, conversas e apoio durante todo este trabalho. Ao VITOR VIANA BANDEIRA e ao FELIPE TODESCHINI BORTOLLON, pelas caronas, trabalhos, churras e parceria. Leo Brendler e Leo Barlette pelas parcerias e pelas conversas descontraídas no laboratório. Mais além, Mateus, Alexandra, Calebe,

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“…Although experimental measurement of SETs has been accomplished with a variety of techniques [13,14,15,16], few works could distinguish SETs originating from PMOS transistors (P-hit) and NMOS transistors (N-hit) directly. For instance, a circuit design for separating SET is described in [17].…”

Section: Introductionmentioning

confidence: 99%

Characterization of P-hit and N-hit single-event transient using heavy ion microbeam

Song

Shao

Liang

et al. 2019

IEICE Electron. Express

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P-hit and N-hit single-event transients are investigated using heavy ion microbeam. A novel layout placement was implemented in the test chip to distinguish SETs originating from P-hit and N-hit. Experimental results indicate both the P-hit and N-hit SETs show an exponentiallike distribution in all target circuits. The SET cross sections and the average pulse width for P-hit and N-hit are also investigated. The well process, the transistor size and the layout topology significantly impact on the cross sections. Only the transistor size impacts on the average pulse width at low LET.

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On-Chip Measurement of Single-Event Transients in a 45 nm Silicon-on-Insulator Technology

Cited by 46 publications

References 15 publications

SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects

SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects

Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-Constrained IoT Edge Devices

Characterization of P-hit and N-hit single-event transient using heavy ion microbeam

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