The effects of annealing on the structure of ultra thin Fe films (4 -10 ML) deposited at 150 K on Ag(001) were studied by synchrotron radiation photoelectron diffraction (PED) and x-ray diffraction (XRD). The occurrence of a surfactant-like stage, in which a single layer of Ag covers the Fe film is demonstrated for films of 4-6 ML heated at 500-550 K. Evidence of a stage characterized by the formation of two Ag capping layers is also reported. As the annealing temperature was increased beyond 700 K the surface layers closely resembled the structure of bare Ag(001) with the residual presence of subsurface Fe aggregates. The data illustrate a film dissolution path which is in agreement with recent theoretical models [J. Roussel et al. Phys. Rev. B 60, 13890 (1999)].PACS numbers: 68.35.-p, 68.55.-a The phase immiscibility and the excellent matching between Ag(001) and Fe(001) unit cells (mismatch 0.8 %) make Fe/Ag growth attractive in the field of low dimensionality magnetic systems, such as ultrathin films, 1 multilayers, 2 and small aggregates 3 . At the nanometric scale, atomic exchange processes were found to affect the chemical sharpness of interfaces in films and multilayers.4 Intermixing could be drastically limited at deposition temperatures as low as 140-150 K 4,5,6 at the expense of a poor morphological quality of the film.
7,8The film structural evolution induced by post-growth annealing presents many interesting aspects involving activated atomic exchange processes and affecting magnetic properties.9 Previous experiments, of He and low energy ion scattering on films deposited at 150 K, indicated the formation of a segregated Ag layer upon moderate annealing (550 K). Higher temperatures led to the embedding of Fe into the Ag matrix.10 In those experiments, information on sub-surface layers was attained by ion erosion depth profiling, a destructive technique mainly sensitive to the topmost layer. Many questions remained open about the film structure and morphology evolution during dissolution. Here we address this issue by presenting photoelectron and x-ray diffraction experiments, performed at the ALOISA beam line (ELETTRA, Trieste). PED provides chemically selected data on film structure with an information depth of several layers. It allows to characterize local order in films which are disordered on a long range scale and possesses specific sensitivity to segregation processes.11 Systematic PED measurements have been accompanied with a few XRD rod scans yielding a better sensitivity to the buried interface and the film long range order. The results of this paper allow a comparison with recent models enlightening the dissolution paths of an ultra thin metal film into a different metal, when both subsurface migration of the deposit and phase separation between substrate and deposit are favoured.
17,18Details on the ALOISA system can be found elsewhere.12 The Ag substrate was prepared according to well established procedures.7 Reflection High Energy Electron Diffraction was used to monitor the surfa...