On a dielectric approach to understand Electron Energy Loss Spectra from carbon materials

Calliari, L.; Fanchenko, S. D.; Filippi, M.

doi:10.1016/j.diamond.2006.10.006

Cited by 6 publications

(18 citation statements)

References 11 publications

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“…In this respect, our basis is a phenomenological approach we recently developed for the analysis of EELS spectra from carbon materials. [5,6] The present paper is an extension of this previous work, in which the width of plasmon peaks had not been taken into account. Highly oriented pyrolytic graphite (HOPG) is taken as a case study.…”

Section: Introductionmentioning

confidence: 86%

“…In this figure, we approximate each of the σ , π , σ * , π * DOS by a Gaussian curve. One should note that describing the DOS by Gaussian distributions rather than by δ-functions, as done before, [5,6] is only a first approximation which can be used to get the minimum value of inhomogeneous broadening. In some cases, as for the σ * DOS, the widths are clearly underestimated.…”

Section: Plasmon Peak Width: the Case Of Hopgmentioning

confidence: 99%

“…[5,6] To evaluate the latter, the mean gap (Penn gap) was taken into account, though the HOPG energy gap varies from zero to more than 10 eV in the k-space. Here we are going to consider a first approximation to take such a gap distribution into account.…”

Section: Plasmon Peak Width: the Case Of Hopgmentioning

confidence: 99%

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Plasmon peak inhomogeneous broadening in reflection electron energy loss spectroscopy from carbon materials

Calliari

Fanchenko

Filippi

2008

Surface & Interface Analysis

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In addition to the damping effect on plasmon peak broadening in reflection electron energy loss spectroscopy (REELS), the effect of inhomogeneous broadening is considered. The analysis of experimental data from highly oriented pyrolytic graphite (HOPG) shows that the contribution of inhomogeneous broadening is of the same order as the contribution associated with damping. In other words, the width of plasmon peaks cannot be ascribed only to damping, which is just one among several other contributions in this respect. At variance with other broadening contributions, however, damping is responsible not only for the width of plasmon peaks but also for their energy. For this reason, by showing that accounting for inhomogeneous broadening leads to decrease of the damping parameter, we also show that the plasmon peak-shift associated with damping is less than one could expect otherwise.

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Section: Introductionmentioning

confidence: 86%

Section: Plasmon Peak Width: the Case Of Hopgmentioning

confidence: 99%

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Plasmon peak inhomogeneous broadening in reflection electron energy loss spectroscopy from carbon materials

Calliari

Fanchenko

Filippi

2008

Surface & Interface Analysis

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“…The peak position was then used to calculate the film density assuming carbon has four valence electrons, each with an effective mass of 0.87m e , taking part in plasmon oscillations. 13,14 EELS spectra were also collected in the region of the carbon K-shell ionization edge so that the fraction of sp 2 bonded carbon atoms could be estimated. 15 Energy filtered electron diffraction patterns were collected using the GIF2000 with procedures outlined elsewhere.…”

Section: Experimental Methodsmentioning

confidence: 99%

Microstructural investigation supporting an abrupt stress induced transformation in amorphous carbon films

Lau

Partridge

Taylor

et al. 2009

Journal of Applied Physics

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The intrinsic stress of carbon thin films deposited by filtered cathodic arc was investigated as a function of ion energy and Ar background gas pressure. The microstructure of the films was analyzed using transmission electron microscopy, electron energy loss spectroscopy, and Raman spectroscopy. The stress at given substrate bias was reduced by the presence of an Ar background gas and by the presence of a Cu underlayer deposited onto the substrate prior to deposition. Auger electron spectroscopy depth profiles showed no evidence of Ar incorporation into the films. A sharp transition from a sp 2 to sp 3 rich phase was found to occur at a stress of 6.5Ϯ 1.5 GPa, independent of the deposition conditions. The structural transition at this value of stress is consistent with available data taken from the literature and also with the expected value of biaxial stress at the phase boundary between graphite and diamond at room temperature. The microstructure of films with stress in the transition region near 6.5 GPa was consistent with a mixture of sp 2 and sp 3 rich structures.

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“…In pyrolytic graphite the average direct band gap (Penn gap 20 ) is hx Penn $ 12 eV. 21 Thus, the energy loss at a scattering wave vector k may be modeled as…”

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confidence: 99%

Tracking the density evolution in counter-propagating shock waves using imaging X-ray scattering

Zastrau

Gamboa

Kraus

et al. 2016

Applied Physics Letters

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We present results from time-resolved X-ray imaging and inelastic scattering on collective excitations. These data are then employed to infer the mass density evolution within laser-driven shock waves. In our experiments, thin carbon foils are first strongly compressed and then driven into a dense state by counter-propagating shock waves. The different measurements agree that the graphite sample is about twofold compressed when the shock waves collide, and a sharp increase in forward scattering indicates disassembly of the sample 1 ns thereafter. We can benchmark hydrodynamics simulations of colliding shock waves by the X-ray scattering methods employed.

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On a dielectric approach to understand Electron Energy Loss Spectra from carbon materials

Cited by 6 publications

References 11 publications

Plasmon peak inhomogeneous broadening in reflection electron energy loss spectroscopy from carbon materials

Plasmon peak inhomogeneous broadening in reflection electron energy loss spectroscopy from carbon materials

Microstructural investigation supporting an abrupt stress induced transformation in amorphous carbon films

Tracking the density evolution in counter-propagating shock waves using imaging X-ray scattering

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