Omega filter installed in the 1MV microscope of Kyushu University

Omoto, Kazuya; Tsuno, K.; Ohsaki, Mitsuaki; Matsumura, Shuichi; Tomokiyo, Yoshitsugu

doi:10.1016/j.micron.2007.10.011

Cited by 13 publications

(3 citation statements)

References 6 publications

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“…From the TEM viewing screen, a Cu 6 Sn 5 grain was selected. To enhance the image contrast in the thick (500 nm) sample, an in-column omega-type filter was used to filter the plasmon contributions to the image [21,22]. The sample was tilted to a low-index zone axis of this grain and selected area electron diffraction (SAED) patterns were obtained.…”

Section: Methodsmentioning

confidence: 99%

In Situ Observation of Liquid Solder Alloys and Solid Substrate Reactions Using High-Voltage Transmission Electron Microscopy

et al. 2022

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The complex reaction between liquid solder alloys and solid substrates has been studied ex-situ in a few studies, utilizing creative setups to “freeze” the reactions at different stages during the reflow soldering process. However, full understanding of the dynamics of the process is difficult due to the lack of direct observation at micro- and nano-meter resolutions. In this study, high voltage transmission electron microscopy (HV-TEM) is employed to observe the morphological changes that occur in Cu6Sn5 between a Sn-3.0 wt%Ag-0.5 wt%Cu (SAC305) solder alloy and a Cu substrate in situ at temperatures above the solidus of the alloy. This enables the continuous surveillance of rapid grain boundary movements of Cu6Sn5 during soldering and increases the fundamental understanding of reaction mechanisms in solder solid/liquid interfaces.

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Section: Methodsmentioning

confidence: 99%

In Situ Observation of Liquid Solder Alloys and Solid Substrate Reactions Using High-Voltage Transmission Electron Microscopy

et al. 2022

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“…The thick lamella sample (Figure 1a) was characterised using a JEM-1300NEF (JEOL, Akishima, Japan) at an accelerating voltage of 1250 kV. This HV-TEM at the Research Laboratory for High Voltage Electron Microscopy, Kyushu University, is equipped with an in-column omega-type energy filter and this has the advantage of allowing thicker specimens to be imaged at higher contrast [19,20]. The beam induced heating on Cu 6 Sn 5 is about 0.5 times less (see Appendix A) in the case of high voltage compared to conventional low voltage TEM, allowing for proper observations on the metastable sample.…”

Section: Methodsmentioning

confidence: 99%

Imaging the Polymorphic Transformation in a Single Cu6Sn5 Grain in a Solder Joint

et al. 2018

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In-situ observations of the polymorphic transformation in a single targeted Cu6Sn5 grain constrained between Sn-0.7 wt % Cu solder and Cu-Cu3Sn phases and the associated structural evolution during a solid-state thermal cycle were achieved via a high-voltage transmission electron microscope (HV-TEM) technique. Here, we show that the monoclinic η′-Cu6Sn5 superlattice reflections appear in the hexagonal η-Cu6Sn5 diffraction pattern upon cooling to isothermal 140 °C from 210 °C. The in-situ real space imaging shows that the η′-Cu6Sn5 contrast pattern is initiated at the grain boundary. This method demonstrates a new approach for further understanding the polymorphic transformation behavior on a real solder joint.

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“…However, the number of inelastically-scattered electrons increases with the specimen thickness along the electron beam direction, and the quality of images is degraded by chromatic aberration associated with the energy loss of the electrons. The UHVEM installed at the Ultramicroscopy Research Center, Kyushu University is equipped with an energy filter, 10) which enables imaging using an electron beam with a specific energy. Sadamatsu et al 11) examined a single crystalline Si including artificially introduced high-density dislocations using energy-filtered UHVEM in combination with electron energy-loss spectroscopy, and demonstrated that the dislocations are clearly visible even in bulk specimens over 10 µm-thick.…”

Section: Observation Of Dislocations In Micrometer-thick Specimensmentioning

confidence: 99%

Review of “12th Japanese-Polish Joint Seminar on Micro and Nano Analysis (August 29–September 1, 2018)”

Ishimaru

2021

Mater. Trans.

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The main purpose of this seminar is to discuss the structural analysis of materials by electron microscopy techniques. Among the papers presented at the seminar, this article briefly reviews the following topics: observations of dislocations in a thick specimen by ultra-high voltage electron microscopy, suppression of geometric phase shift due to antiphase boundaries in dark-field electron holography, and structural characterization of amorphous materials by electron diffraction techniques.

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Omega filter installed in the 1MV microscope of Kyushu University

Cited by 13 publications

References 6 publications

In Situ Observation of Liquid Solder Alloys and Solid Substrate Reactions Using High-Voltage Transmission Electron Microscopy

In Situ Observation of Liquid Solder Alloys and Solid Substrate Reactions Using High-Voltage Transmission Electron Microscopy

Imaging the Polymorphic Transformation in a Single Cu6Sn5 Grain in a Solder Joint

Review of “12th Japanese-Polish Joint Seminar on Micro and Nano Analysis (August 29–September 1, 2018)”

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