Abstract:In this paper we describe the off‐line quality control method and its application in optimizing the process for forming contact windows in 3.5‐μm complementary metal‐oxide semiconductor circuits. The off‐line quality control method is a systematic method of optimizing production processes and product designs. It is widely used in Japan to produce high‐quality products at low cost. The key steps of off‐line quality control are: (i) Identify important process factors that can be manipulated and their potential w… Show more
“…In such cases, the performance value corresponding to optimum working conditions can be predicted by utilizing the balanced characteristic of OA. In this respect the aim of the additive model widely applied in the Taguchi method may be used [29].…”
Section: Experimental Parameters and Planmentioning
“…In such cases, the performance value corresponding to optimum working conditions can be predicted by utilizing the balanced characteristic of OA. In this respect the aim of the additive model widely applied in the Taguchi method may be used [29].…”
Section: Experimental Parameters and Planmentioning
“…In such cases, the performance value corresponding to optimum working conditions can be predicted by utilising the balanced characteristic of the orthogonal array. For this, the additive model may be used [18]:…”
“…In such cases, the performance value corresponding to optimum working conditions can be predicted by utilizing the balanced characteristic of OA. In this respect aim the additive model may be used [18].…”
Section: Experimental Plan and Parametersmentioning
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