Proceedings of the 24th Edition of the Great Lakes Symposium on VLSI 2014
DOI: 10.1145/2591513.2591541
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OCV-aware top-level clock tree optimization

Abstract: The clock trees of high-performance synchronous circuits have many clock logic cells (e.g., clock gating cells, multiplexers and dividers) in order to achieve aggressive clock gating and required performance across a wide range of operating modes and conditions. As a result, clock tree structures have become very complex and difficult to optimize with automatic clock tree synthesis (CTS) tools. In advanced process nodes, CTS becomes even more challenging due to on-chip variation (OCV) effects. In this paper, w… Show more

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Cited by 16 publications
(5 citation statements)
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References 18 publications
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“…Shelar [16] proposed a clustering method to reduce the number of buffers and power consumption. Chan et al [17] proposed a linear programming methodology to minimize power consumption, wire length, and timing slew simultaneously. Lin et al [18] proposed an activity-driven clock tree design methodology, including a new tree structure and a corresponding design flow.…”
Section: Clock Treementioning
confidence: 99%
“…Shelar [16] proposed a clustering method to reduce the number of buffers and power consumption. Chan et al [17] proposed a linear programming methodology to minimize power consumption, wire length, and timing slew simultaneously. Lin et al [18] proposed an activity-driven clock tree design methodology, including a new tree structure and a corresponding design flow.…”
Section: Clock Treementioning
confidence: 99%
“…Research [14] proposed a clustering method to reduce the number of buffers and power consumption. Research [15] proposed a linear programming methodology to minimize power consumption, wire length, and timing slew simultaneously. Research [16] proposed an activitydriven clock tree design methodology, including a new tree structure and a corresponding design flow.…”
Section: Clock Treementioning
confidence: 99%
“…1 We also perform a novel stress test of 3DPE by verifying that the model cannot produce unreasonable values of estimated 3D power benefit. While practitioners have struggled with a gap between theoretical limits of 3DIC benefit and observed benefits, our model stress test provides some encouragement in the form of model parameter combinations that suggest potential large 3DIC power benefits.…”
Section: Introductionmentioning
confidence: 99%
“…In our 28nm FDSOI libraries, the size of the largest cell is 4.4µm 2 . The inter-buffer distance is ∼120-150µm[1]. The max transition is 375ps and the max fanout is 20.…”
mentioning
confidence: 99%