2010
DOI: 10.1103/physrevlett.105.146102
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Occurrence of Rotation Domains in Heteroepitaxy

Abstract: Heteroepitaxy can involve materials with a misfit of crystal structure. Rotation domains in the epilayer are a fundamental consequence. We derive a general expression for their (minimum) number which is determined by the mismatch of the rotational symmetries of the substrate and epilayer. In the case of a mismatch of rotational symmetry, the number of rotation domains of material A on material B is different from that of B on A. A larger number of rotation domains can occur due to domain structure or nearly fu… Show more

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Cited by 76 publications
(61 citation statements)
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“…When GST is grown on singular Si (top black curve) diffraction peaks of the same intensities are measured every 60° whereas the substrate has 3-fold symmetry (bottom gray curve). This is the evidence of GST twin domains formation due to weak interaction at the interface with the substrate 18 , as expected in the case of vdW epitaxy. In fact, by looking at the topography of this sample by atomic force microscopy (AFM), two triangular domains rotated of 180° are visible (white circles, Fig.…”
Section: Resultssupporting
confidence: 76%
“…When GST is grown on singular Si (top black curve) diffraction peaks of the same intensities are measured every 60° whereas the substrate has 3-fold symmetry (bottom gray curve). This is the evidence of GST twin domains formation due to weak interaction at the interface with the substrate 18 , as expected in the case of vdW epitaxy. In fact, by looking at the topography of this sample by atomic force microscopy (AFM), two triangular domains rotated of 180° are visible (white circles, Fig.…”
Section: Resultssupporting
confidence: 76%
“…This is consistent with Grundmann's theory that mismatch of surface rotational symmetries between film (C2mm) and substrate (C3m) creates domain rotations inside film. 17 C-type lattice alignment corresponds to the observed a and a 0 -domains. Note the adjacent two type-I sublattices of Al 2 O 3 exhibit reflection symmetry.…”
mentioning
confidence: 58%
“…1(c) shows φ scans of the asymmetric Na 2 IrO 3 (202) and the YAO (101) and (121) reflections. From the mismatch between rotational symmetry C n and C m of film and substrate, which is C 1 for Na 2 IrO 3 and C 2 for YAO, one expects to observe two rotational domains, 27 i.e., two reflections in a φ scan of the Na 2 IrO 3 (202) reflection. Instead, we observe six reflections and assume that this increased number of rotational domains is either due to a mixed terminated surface of the YAO substrate containing half unit cell step heights 28 or other nearly fulfilled additional symmetries of the substrate surface.…”
mentioning
confidence: 99%