Observation of strain and temperature induced changes in the band structure of thin La0.8MnO3−δ films

Abstract

Mn K-edge resonant inelastic x-ray scattering measurements were performed on films of La0.8MnO3−δ. The measurements reveal that strain causes large shifts of the bands above the Fermi level. The Mn 3d band switches from a narrow upshifted peak at high temperature to a broad bulklike band at low temperature in ultrathin films. The strain induced switching behavior opens the possibility of tuning the transition to higher temperatures for device applications in this class of manganite materials.

Momentum dependence in K-edge resonant inelastic x-ray scattering and its application to screening dynamics in CE-phase La$_{0.5}$Sr$_{1.5}$MnO$_4$

“…There has been a great interest recently in K-edge resonant inelastic x-ray scattering (RIXS), [1][2][3][4][5][6][7][8] particularly in transition metal oxides, because of its unique advantages over other probes. In this spectroscopy, hard x-rays with energies of the order of 10 keV excite transition-metal 1s electrons into empty 4p levels, which decay back to the 1s levels.…”