We experimentally studied the effects of the C atom on bandgap E G modulation in two-dimensional (2D) silicon carbon alloys, Si 1%Y C Y , fabricated by hot C + ion implantation into the (100) SOI substrate in a wide range of Y (4 ' 10 %5 : Y : 0.13), in comparison with the characteristics of 3D silicon carbide (SiC). X-ray photoelectron spectroscopy (XPS) and UV-Raman analysis confirm the Si-C, CC , and Si-Si bonds in the 2D-Si 1%Y C Y layer. The photoluminescence (PL) method shows that the E G and PL intensity I PL of 2D-Si 1%Y C Y drastically increase with increasing Y for high Y (;0.005), and thus we demonstrated a high E G of 2.5 eV and a visible wavelength λ PL less than 500 nm. Even for low Y (<10 %3), I PL of 2D-Si 1%Y C Y also increases with increasing Y, owing to the compressive strain of the 2D-Si 1%Y C Y layer caused by the C atoms, but the Y dependence of E G is very small. E G of 2D-Si 1%Y C Y can be controlled by changing Y. Thus, the 2D-Si 1%Y C Y technique is very promising for new E G engineering of future high-performance CMOS and Si photonics.