1999
DOI: 10.1103/physrevlett.82.2326
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Observation of Molecular Layering in Thin Liquid Films Using X-Ray Reflectivity

Abstract: We report the direct observation of internal layering in thin (ϳ45 90 Å) liquid films of nearly spherical, nonpolar molecules, tetrakis(2-ethylhexoxy)silane, using synchrotron x-ray reflectivity. The Patterson functions have secondary maxima indicating layer formation, and model-independent fitting to the reflectivity data shows that there are three electron density oscillations near the solid-liquid interface, with a period of ϳ10 Å (consistent with the molecular dimensions). The oscillation amplitude has a s… Show more

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Cited by 228 publications
(146 citation statements)
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“…This is consistent with some researchers [54][55][56][57] which considered the thickness of nanolayer between 1 and 3nm. However, previous research on the solid-liquid interface [51][52][53] showed that the nanolayer consist of different layer at the interface of the solid-liquid which can conclude that the property of nanolayer should be started from void to the base fluid. In this way the average thickness of the nanolayer of the nanofluids must be more than the tv.…”
Section: Model Development Results and Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…This is consistent with some researchers [54][55][56][57] which considered the thickness of nanolayer between 1 and 3nm. However, previous research on the solid-liquid interface [51][52][53] showed that the nanolayer consist of different layer at the interface of the solid-liquid which can conclude that the property of nanolayer should be started from void to the base fluid. In this way the average thickness of the nanolayer of the nanofluids must be more than the tv.…”
Section: Model Development Results and Discussionmentioning
confidence: 99%
“…They concluded that the ordering of an interfacial layer in solidliquid interface is independent of liquid film thickness. Yu et al [51] studied interfacial properties of thin liquid film of TEHOS (tetrakis(2-ethylhexoxy)silane) on silicon (111) substrate by X-ray reflectivity. They showed that three electron density oscillations near the interface with a period of about 1nm, which is consistent with molecular density.…”
Section: Solid-liquid Interfacial Layermentioning
confidence: 99%
“…1 In liquid films close to a flat solid surface, molecular layering is observed, [2][3][4] which is enhanced by confinement between two solid surfaces. New tools to study confined liquids include surface force apparatus (SFA), 2,5,6 atomic force microscopy (AFM), 7,8 and spectroscopic techniques 9 such as fluorescence correlation spectroscopy (FCS).…”
Section: Introductionmentioning
confidence: 99%
“…X-ray and neutron reflectivity have been extensively used to determine the density profiles at the free surfaces of many liquids [6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25] including water, 22,25 and also at liquid-solid [26][27][28] and liquidliquid [29][30] interfaces. These probes are sensitive to electron density and scattering length density respectively, and for a known material these are both measures of the local mass density.…”
Section: Introductionmentioning
confidence: 99%