1993
DOI: 10.1143/jjap.32.l971
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Observation of Microdefects in As-Grown Czochralski Silicon Crystals by Synchrotron Radiation Topography

Abstract: We study the level spacing distribution p(s) in the spectrum of random networks. According to our numerical results, the shape of p(s) in the Erdős-Rényi (E-R) random graph is determined by the average degree k and p(s) undergoes a dramatic change when k is varied around the critical point of the percolation transition, k = 1. When k 1, the p(s) is described by the statistics of the Gaussian orthogonal ensemble (GOE), one of the major statistical ensembles in Random Matrix Theory, whereas at k = 1 it follows t… Show more

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