Our system is currently under heavy load due to increased usage. We're actively working on upgrades to improve performance. Thank you for your patience.
2023
DOI: 10.1063/5.0164950
|View full text |Cite
|
Sign up to set email alerts
|

Observation of laser ablation of silicon as a function of pulse length at constant fluence via time-resolved x-ray spectroscopy

T. R. Joshi,
M. Bailly-Grandvaux,
R. E. Turner
et al.

Abstract: We investigate the ablation of silicon as a function of laser pulse length at a constant fluence using time-resolved x-ray spectroscopy data obtained from OMEGA EP experiments at the University of Rochester's Laboratory for Laser Energetics. Our targets consisted of three-layer planar structures composed of Si (50 μm), Cu (25 μm), and SiO2 (500 μm) layers. The Si layer was irradiated by a 351-nm laser with varying pulse widths of 250 ps, 500 ps, 1 ns, and 10 ns while maintaining a constant fluence of ∼27.9 kJ/… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 29 publications
0
1
0
Order By: Relevance
“…Nevertheless, there remains a notable gap in the exploration of single pulse damage, particularly when considering different doping concentrations over a range of intensities. Research done by Leyder et al investigated silicon damage induced by single 1.3 µm femtosecond pulses amidst varying free carrier densities 5 . Recent endeavors such as an Omega EP experiment delve into creating high pressure on silicon from plasma generation at intensities exceeding 10 14 W/cm 2 .…”
Section: Introductionmentioning
confidence: 99%
“…Nevertheless, there remains a notable gap in the exploration of single pulse damage, particularly when considering different doping concentrations over a range of intensities. Research done by Leyder et al investigated silicon damage induced by single 1.3 µm femtosecond pulses amidst varying free carrier densities 5 . Recent endeavors such as an Omega EP experiment delve into creating high pressure on silicon from plasma generation at intensities exceeding 10 14 W/cm 2 .…”
Section: Introductionmentioning
confidence: 99%