Observation and analysis of mixed domain states in sputtered Co50Fe50 films

Voltage-induced modification in magnetic coercivity of patterned Co50Fe50 thin film on piezoelectric substrate

“…Any differences are expected as the substrate used and patterning process may induce quantitatively different strain states on deposited Co 50 Fe 50 . Thus, all samples are characterized by an in-plane magnetic anisotropy, well consistently to the stress-thickness phase diagram of Co 50 Fe 50 thin films on Si substrates [17], where for thicknesses below 50 nm, no stripe magnetic domains develop and magnetization lies in plane regardless degree of texture.…”

Magnetic and structural investigation of growth induced magnetic anisotropies in Fe50Co50thin films

“…Indeed, when sputtering deposition is considered, the deposited film may develop an intrinsic stress, that can be compressive due to the atomic peening process [5]. In this case, as the FeCo magnetostrictive constants are positive [10], the presence of an in-plane compressive stress may favour the development of an outof-plane easy axis of magnetization [11].…”

“…When t = 10 nm, σ f ∼ -600 MPa; taking into account the values of FeCo magnetostrictive constants [10] and the fact that the films are polycrystalline [11], this corresponds to an out-of-plane anisotropy constant, K σ , whose value is equal to 6. constant, K s ∼ -13 · 10 5 J/m 3 , we have that |K s | > K σ , so the shape anisotropy overcomes the magnetoelastic contribution and the samples magnetization preferentially lies in the plane of the film. As t increases, the change in curvature increases and eventually the K σ value overcomes the K s one.…”

Nanoscopic Investigation of Magnetic Thin Films by Means of Magnetic Force Microscopy Technique

“…[8][9][10][11][12][13][14][15]. In addition, in the case of the magnetic thin films, their magnetic properties are conditioned by the magnetic domain structure [16][17][18]. In order to obtain the information about the magnetic domains structure, one can use magnetic force microscopy (MFM) [19,20].…”