Abstract:Given the ever increasing complexity of conducting failure analysis on today's latest generation manufacturing processes, the authors have investigated and implemented OBIRCH techniques into process development failure analysis practices. They describe their applications of OBIRCH to 120, 90, and 65 nm samples and their methods for interpreting the results. The OBIRCH technique has the ability to address faults within most structure types and quickly give information on a number of failing sites. It has proven… Show more
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