2004
DOI: 10.1103/physrevb.70.165408
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OK-edge x-ray absorption study of ultrathinNiOepilayers depositedin situonAg(001)

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Cited by 28 publications
(24 citation statements)
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“…XAS sees the average lattice parameter within the probing volume, while LEED is most sensitive to the topmost layer. It is interesting to note that the thickness range where MLD saturates ðt c Þ is close to the 50ML film with near-bulk lattice parameters [3], confirming that the decrease of MLD with increase of thickness is indeed a strain induced effect.…”
Section: Article In Pressmentioning
confidence: 78%
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“…XAS sees the average lattice parameter within the probing volume, while LEED is most sensitive to the topmost layer. It is interesting to note that the thickness range where MLD saturates ðt c Þ is close to the 50ML film with near-bulk lattice parameters [3], confirming that the decrease of MLD with increase of thickness is indeed a strain induced effect.…”
Section: Article In Pressmentioning
confidence: 78%
“…It is found from LEED studies of NiO(0 0 1) thin films on Ag(0 0 1) [7] that the surface in-plane lattice parameter is fully relaxed at a thickness of 20ML. Another study using Oxygen K-edge XAS [3], it was shown that the experimental lattice parameters were close to that of bulk single crystal, by about 50ML thickness of NiO(0 0 1). This difference in the critical thickness between the two techniques can be understood as the sample probing depth of XAS is quite different compared to LEED.…”
Section: Article In Pressmentioning
confidence: 87%
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“…This makes XANES a very powerful instrument for direct structural characterization in a wide range of systems, including semiconductors [83,103], superconductors [104], oxides [105][106][107][108][109], catalysts [82,102,[110][111][112][113][114][115][116][117], solutions [118], surfaces and interfaces [119][120][121], and biological [122][123][124][125][126], geological [127][128][129][130] and hybrid organic-inorganic materials [113,[131][132][133]. The relation between geometrical features and XANES response mainly depends on the multiple-scattering processes (figure 5c) of the excited photoelectron after the ionization threshold, which dominate with respect to the single-scattering events due to the lowered photoelectron energy.…”
Section: X-ray Transient Absorption: Theoretical Background and Expermentioning
confidence: 99%
“…the growth of NiO on Ag(1 0 0), has been thoroughly studied and the NiO/Ag(1 0 0) interface has assumed the status of a reference system for a well-matched ultrathin film [26][27][28][29][30][31][32].…”
Section: Introductionmentioning
confidence: 99%