2020
DOI: 10.1016/j.ijleo.2019.163646
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Numerical simulation of charge transport layer free perovskite solar cell using metal work function shifted contacts

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Cited by 36 publications
(11 citation statements)
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“…The main reason for such superior results is the thicknesses of the ZnO layer (100 nm) and the silicon layer (100 μm) for which the structure is considered ideal. Rong [43] simulated n-CH 3 NH 3 PbI 3 /p-Silicon heterojunction solar cell in Silvaco TCAD for which an open circuit voltage of 0.41 V was obtained, which is similar to [44]. Fig.…”
Section: I-v Characteristicssupporting
confidence: 57%
See 1 more Smart Citation
“…The main reason for such superior results is the thicknesses of the ZnO layer (100 nm) and the silicon layer (100 μm) for which the structure is considered ideal. Rong [43] simulated n-CH 3 NH 3 PbI 3 /p-Silicon heterojunction solar cell in Silvaco TCAD for which an open circuit voltage of 0.41 V was obtained, which is similar to [44]. Fig.…”
Section: I-v Characteristicssupporting
confidence: 57%
“…[43], all of the open circuit voltages of our solar cells are smaller than 0.45 V, which is mainly due to metal's work-function of 4.3 eV, used as an ohmic contact in our simulations. In addition, it is proven that the open circuit voltage strongly depends on the metal work-function according to electric boundary conditions [44].…”
Section: I-v Characteristicsmentioning
confidence: 99%
“…Further increasing the defect density, the PCE reduces the minority charge carrier's diffusion length due to the equivalent recombination rate and generation rate. [ 61,62 ] Deep level defects act as Shockley Real‐Hall nonradiative recombination centers, which reduces the minority charge carriers. [ 54 ] To improve the defect diffusion length and the carrier lifetime of minority charge carriers, defect density should be low, which can be achieved by optimizing the materials processing conditions and thus improving the crystallinity.…”
Section: Resultsmentioning
confidence: 99%
“…N t significantly impacts the lifetime of minority charge carriers, which is also a result of intraband carrier recombination. With a further increase in N t , the diffusion length of the minority charge carriers reduces for the same recombination and generation rate, which lowers the PCE. , The negative impact beyond a significant defect density in the absorber layer is noticeable because of the enhanced scattering of photogenerated charge carriers at these defect sites. The minority charge carriers start reducing as a result of the Shockley–Read–Hall nonradiative recombination centers, which is typically the function at high defect levels .…”
Section: Resultsmentioning
confidence: 99%