1997
DOI: 10.1016/s0022-0248(97)00257-1
|View full text |Cite
|
Sign up to set email alerts
|

Numerical simulation and validation of the Peltier pulse marking of solid/liquid interfaces

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
10
0

Year Published

2001
2001
2024
2024

Publication Types

Select...
8
1

Relationship

1
8

Authors

Journals

citations
Cited by 26 publications
(10 citation statements)
references
References 15 publications
0
10
0
Order By: Relevance
“…This is of importance because the investigation on the interface curvature is made by applying electrical pulses to the sample at regular intervals. In this way, the Joule effect and the Peltier effect generate heat close to the interface which modify the solidification velocity and has an impact on the incorporated solute [35]. This disturbance can be revealed by subsequent cutting, polishing and etching of the sample: the shape of the interface at the moment of the pulse is materialized by a thin line revealed on the polished, etched surface.…”
Section: Semiconductor Alloy Crucible and Cartridge Assemblymentioning
confidence: 99%
“…This is of importance because the investigation on the interface curvature is made by applying electrical pulses to the sample at regular intervals. In this way, the Joule effect and the Peltier effect generate heat close to the interface which modify the solidification velocity and has an impact on the incorporated solute [35]. This disturbance can be revealed by subsequent cutting, polishing and etching of the sample: the shape of the interface at the moment of the pulse is materialized by a thin line revealed on the polished, etched surface.…”
Section: Semiconductor Alloy Crucible and Cartridge Assemblymentioning
confidence: 99%
“…Since the heat diffusion is highly correlated to the current direction as well as the physical property differences between the solid and liquid phase, solidification of two different pure substances (Sn and Bi) is simulated in this study, and parameter values for the simulations can be found in ref. [20]. As shown in fig.…”
Section: Phase-field Modeling and Simulationmentioning
confidence: 90%
“…Because of the action of the pulsed current, the solute elements in the liquid phase will not only undergo diffusion, but also a strong convection [18], but a very thin solute diffusion layer will still exist at the solid-liquid interface, denoted by 𝛿 𝑐 , as in figure 2. Assuming that the solute element's diffusion coefficient is a fixed value and is not affected by temperature, and not considering the solute element diffusion in the solid phase, then according to the conservation of solute mass, when the solute diffusion layer reaches a steady state there are:…”
Section: Diffusion Kinetics Of Ti Elements In the Two-phase Region Wi...mentioning
confidence: 99%