2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and 2013
DOI: 10.1109/eurosime.2013.6529989
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Numerical modeling of the electroplating process for microvia fabrication

Abstract: For numerical simulation of electrodeposition in small features, we have developed a novel method that allows an explicit tracking of the interface between the electrolyte and the deposited metal. The method is implemented in the CFD package PHYSICA and validated by comparing the delivered simulation results with those achieved by real-life measurements and/or obtained by another piece of software, COM SOL Multiphysics using a standard electrodeposition module.

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Cited by 3 publications
(3 citation statements)
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“…The EITM under the conditions of basic ED has been validated against real-life experiments and known benchmarks [1]. The obtained numerical results demonstrate that basic ED does not guarantee a good quality filling of micro features, even for relatively low AR such as 1:1.…”
Section: Numerical Modeling Of Basic Edmentioning
confidence: 91%
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“…The EITM under the conditions of basic ED has been validated against real-life experiments and known benchmarks [1]. The obtained numerical results demonstrate that basic ED does not guarantee a good quality filling of micro features, even for relatively low AR such as 1:1.…”
Section: Numerical Modeling Of Basic Edmentioning
confidence: 91%
“…See Under basic ED conditions, it is assumed that the electrolyte is a still solution with no additives. As shown by numerical and real-life experiments [1], basic ED does not guarantee via fillings of an acceptable quality. This is usually attributed to insufficient ion transport into the via over time.…”
Section: Introductionmentioning
confidence: 99%
“…One such approach is to use the Arbitrary Lagrangian-Eulerian (ALE) [10] or a dynamic mesh method [2] that moves the mesh based on the motion of a boundary. Other approaches include a level set method [7][8][9], an explicit interface tracking method (EITM) [12,13], and the finite area method (FAM) [1]. Here the FAM is used because the growth of the copper layer is small in comparison to the domain size, and, therefore, would have negligible effects on the motion of the fluid.…”
Section: Introductionmentioning
confidence: 99%