2022
DOI: 10.1016/j.measurement.2021.110306
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Numerical method for tilt compensation in scanning acoustic microscopy

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Cited by 12 publications
(13 citation statements)
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“…5), integrated with a Standa (8MTF-200-Motorized XY Microscope Stage) high precision scanning stage which controlled by LabVIEW [28]. A similar SAM was employed earlier by our group to determine and correct on the inclined sample [29]. The acoustic microscopic features were implemented using National Instruments' PXIe FPGA modules and FlexRIO hardware.…”
Section: Methodsmentioning
confidence: 99%
“…5), integrated with a Standa (8MTF-200-Motorized XY Microscope Stage) high precision scanning stage which controlled by LabVIEW [28]. A similar SAM was employed earlier by our group to determine and correct on the inclined sample [29]. The acoustic microscopic features were implemented using National Instruments' PXIe FPGA modules and FlexRIO hardware.…”
Section: Methodsmentioning
confidence: 99%
“…Our group had previously utilised a similar SAM to identify and correct inclined samples, as reported in a previous study. 21 National Instruments' PXIe FPGA modules and FlexRIO hardware were utilised to implement the acoustic microscopic features. These were housed in a PXIe chassis (PXIe-1082), which included an arbitrary waveform generator (AT-1212).…”
Section: F I G U R Ementioning
confidence: 99%
“…Prakhar et al proposed a tilt correction method that involves selecting three points on the same plane of the object, finding the angle of inclination, and correcting for artefacts caused by the inclination. 21 The correction of sample surface inclination is performed during the postprocessing phase of each A-scan in the time domain. However, this method has a limitation that it relies on prior knowledge of the sample's surface or shape and the exact position of the specimen's surface in space.…”
Section: Introductionmentioning
confidence: 99%
“…The image of SAM, as depicted in Figure 2, has been annotated to highlight its key components or operational 3/13 settings and serves as a reference for image acquisition. More comprehensive explanations of the operational principles for these modes can be found in the following literature 21,22 . In this article, our emphasis lies in the utilization of the reflection mode for scanning samples.…”
Section: Scanning Acoustic Microscopic Imagingmentioning
confidence: 99%
“…This SAM system featured a Standa high-precision scanning stage (8MTF-200-Motorized XY Microscope Stage) for gathering experimental data. Acoustic imaging capabilities were enabled using National Instruments' PXIe FPGA modules and FlexRIO hardware housed in a PXIe chassis (PXIe-1082) with an integrated arbitrary waveform generator (AT-1212) [21][22][23] . The transducer was excited with Mexican hat signals and amplified using an RF amplifier (AMP018032-T).…”
Section: Xy Manual Stage Controllermentioning
confidence: 99%