1992
DOI: 10.1109/16.155890
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Numerical large-signal simulation of the diffusion noise in GaAs Gunn devices

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Cited by 4 publications
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“…To date, this standard method and its further developments implemented by various research groups [2][3][4][5][6][7][8][9][10][11][12][13][14] represents the most powerful theoretical approach to investigate voltage fluctuations in devices which are described within a deterministic approach (the so called medium equations) such as drift-diffusion (DD), hydrodynamic (HD), Boltzmann transport equation (BTE), etc. When compared with more recent stochastic approaches, such as the Monte Carlo (MC) method [15], the IF method offers the significant advantage of analyzing separately both the noise sources, and the transfer field responsible of their spatio-temporal evolution.…”
Section: Introductionmentioning
confidence: 99%
“…To date, this standard method and its further developments implemented by various research groups [2][3][4][5][6][7][8][9][10][11][12][13][14] represents the most powerful theoretical approach to investigate voltage fluctuations in devices which are described within a deterministic approach (the so called medium equations) such as drift-diffusion (DD), hydrodynamic (HD), Boltzmann transport equation (BTE), etc. When compared with more recent stochastic approaches, such as the Monte Carlo (MC) method [15], the IF method offers the significant advantage of analyzing separately both the noise sources, and the transfer field responsible of their spatio-temporal evolution.…”
Section: Introductionmentioning
confidence: 99%