2016
DOI: 10.3390/electronics5030052
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Numerical Drift-Diffusion Simulation of GaAs p-i-n and Schottky-Barrier Photodiodes for High-Speed AIIIBV On-Chip Optical Interconnections

Abstract: Abstract:In this paper, we consider the problem of the research and development of high-speed semiconductor photodetectors suitable for operation as parts of on-chip optical interconnections together with the high-speed laser modulators based on the A III B V nanoheterostructures. This research is aimed at the development of the models and modelling aids designed for the simulation of carrier transport and accumulation processes taking place in on-chip photosensitive devices during the detection of subpicoseco… Show more

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Cited by 13 publications
(12 citation statements)
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“…Carrier mobilities, and generation and recombination rates for the next instant are estimated after the solution of the Poisson's equation at the actual moment of time. In paper [21] we showed that the application of Gummel's method together with the explicit and upwind difference schemes allows for the reduction in consumption of computational resources, but requires a shorter time step than other approaches.…”
Section: Explicit Techniquementioning
confidence: 99%
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“…Carrier mobilities, and generation and recombination rates for the next instant are estimated after the solution of the Poisson's equation at the actual moment of time. In paper [21] we showed that the application of Gummel's method together with the explicit and upwind difference schemes allows for the reduction in consumption of computational resources, but requires a shorter time step than other approaches.…”
Section: Explicit Techniquementioning
confidence: 99%
“…The following Dirichlet boundary conditions for Equations (1)-(6) are applied at ohmic and Schottky contacts in the case of fixed voltage mode [21]:…”
mentioning
confidence: 99%
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“…This drift is given by the transit time of the photogenerated electrons and holes across the depletion layer and is given by 23 0.25emτtr=Wbold-italicVbold-italicd where W is the width of the depletion layer, and V d denotes the drift velocity of the charge carriers. The drift velocity is given by 24 Vd=μ0.25emE where μ denotes the carrier mobility, and E is the incident electric field on the PD.…”
Section: Simulation Resultsmentioning
confidence: 99%
“…Drift-diffusion numerical simulation of conventional on-chip p-i-n, Schottky barrier and uni-travelling carrier (UTC) photodetectors demonstrated that their response time is restricted by semiclassical transport effects in A III B V semiconductor materials and exceeds several picoseconds for the most efficient structures [17,[19][20][21]. Such performance is not sufficient for the adequate detection of short optical pulses generated by the lasers-modulators.…”
Section: Introductionmentioning
confidence: 99%