Numerical correction for secondary fluorescence across phase boundaries in EPMA

Escuder, JA; Salvat, F.; Llovet, Xavier; Donovan, John J.

doi:10.1088/1757-899x/7/1/012008

Cited by 8 publications

(2 citation statements)

References 6 publications

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“…In this work we describe a semi-analytical method for the fast calculation of secondary fluorescence for homogeneous samples and material couples, including characteristic and continuum fluorescence. Preliminary results have been presented elsewhere (Escuder et al 2010).…”

Section: Introductionmentioning

confidence: 99%

Secondary fluorescence in electron probe microanalysis of material couples

Llovet¹,

Pinard²,

Donovan³

et al. 2012

J. Phys. D: Appl. Phys.

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We describe a semi-analytical method for the fast calculation of secondary fluorescence in electron probe microanalysis of material couples. The calculation includes contributions from primary K-, Land M-shell characteristic x-rays and bremsstrahlung photons. The required physical interaction parameters (subshell partial cross sections, attenuation coefficients, etc) are extracted from the database of the Monte Carlo simulation code system PENELOPE. The calculation makes use of the intensities of primary photons released in interactions of beam electrons and secondary electrons. Since these intensities are not readily available and do not allow analytical calculation, they are generated from short Monte Carlo simulation runs. The reliability of the proposed calculation method has been assessed by comparing calculated, distance-dependent k-ratios with experimental data available in the literature and with results from simulations with PENELOPE. Numerical results are found to be in close agreement with both simulated and experimental data.

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Section: Introductionmentioning

confidence: 99%

Secondary fluorescence in electron probe microanalysis of material couples

Llovet¹,

Pinard²,

Donovan³

et al. 2012

J. Phys. D: Appl. Phys.

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“…If the number of generated tracks is large enough, quantitative information on the transport process may be obtained by averaging over a statistically significant number of trajectories. In this work, the PENELOPE routine package (Salvat et al, 2009) has been chosen as it has proved to adequately describe EPMA experimental situations (Acosta et al, 1998; Llovet et al, 2003; Salvat et al, 2006; Escuder et al, 2008, 2010).…”

Section: Introductionmentioning

confidence: 99%

Monte Carlo Simulation of Characteristic Secondary Fluorescence in Electron Probe Microanalysis of Homogeneous Samples Using the Splitting Technique

Petaccia

Castellano

2015

Microsc Microanal

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Electron probe microanalysis (EPMA) is based on the comparison of characteristic intensities induced by monoenergetic electrons. When the electron beam ionizes inner atomic shells and these ionizations cause the emission of characteristic X-rays, secondary fluorescence can occur, originating from ionizations induced by X-ray photons produced by the primary electron interactions. As detectors are unable to distinguish the origin of these characteristic X-rays, Monte Carlo simulation of radiation transport becomes a determinant tool in the study of this fluorescence enhancement. In this work, characteristic secondary fluorescence enhancement in EPMA has been studied by using the splitting routines offered by PENELOPE 2008 as a variance reduction alternative. This approach is controlled by a single parameter NSPLIT, which represents the desired number of X-ray photon replicas. The dependence of the uncertainties associated with secondary intensities on NSPLIT was studied as a function of the accelerating voltage and the sample composition in a simple binary alloy in which this effect becomes relevant. The achieved efficiencies for the simulated secondary intensities bear a remarkable improvement when increasing the NSPLIT parameter; although in most cases an NSPLIT value of 100 is sufficient, some less likely enhancements may require stronger splitting in order to increase the efficiency associated with the simulation of secondary intensities.

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