1996
DOI: 10.1063/1.471492
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Numerical analysis of x-ray reflectivity data from organic thin films at interfaces

Abstract: Articles you may be interested inXray reflectivity study of behenic acid Langmuir-Blodgett mono and multilayers on SiO2 surfaces asdeposited and after thermal treatment: Influence of substrate/film interactions on molecular ordering and film topology Static and dynamic structural analysis of a saturated solution of ZnBr2 in water: Anomalous xray diffraction and molecular dynamics simulations Near edge xray absorption fine structure investigation of the orientation and thermally induced order-disorder transitio… Show more

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Cited by 43 publications
(45 citation statements)
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“…The error in the fitted parameter t Å 176.5 Å is estimated at D t Å 0.01 Å by the fitting procedure, For example, if the existence of the 30 Å , moisture-rich layer observed in the initial NR 10 experi-which is based on a Marquart-Levenburg fit that minimizes a merit function, x 2 , through variation ments is a universal characteristic of BTDA// ODA/MPD films on silicon substrates, the mois-of a group of specified parameters. 20- 22 The small magnitude of the error estimate D t is a partial ture absorption in thinner films should appear to be greater than in thicker films for which the consequence of this fitting procedure, which minimizes x 2 based on a set of optimized parameters moisture-rich layer constitutes a smaller fraction of the total swollen film thickness. This line of whose individual errors small but correlated.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The error in the fitted parameter t Å 176.5 Å is estimated at D t Å 0.01 Å by the fitting procedure, For example, if the existence of the 30 Å , moisture-rich layer observed in the initial NR 10 experi-which is based on a Marquart-Levenburg fit that minimizes a merit function, x 2 , through variation ments is a universal characteristic of BTDA// ODA/MPD films on silicon substrates, the mois-of a group of specified parameters. 20- 22 The small magnitude of the error estimate D t is a partial ture absorption in thinner films should appear to be greater than in thicker films for which the consequence of this fitting procedure, which minimizes x 2 based on a set of optimized parameters moisture-rich layer constitutes a smaller fraction of the total swollen film thickness. This line of whose individual errors small but correlated.…”
Section: Resultsmentioning
confidence: 99%
“…This line of whose individual errors small but correlated. 22 The parameter set for fitting of the reflectivity reasoning depends on the important assumption that the film structure is not a function of film data discussed in this study include the thicknesses of the polyimide and oxide films, the elec-thickness. This condition is met for the BTDA// ODA/MPD chosen for this study due to its com-tron density of the polyimide film, and the roughness at the polyimide/vacuum and polyim-pletely amorphous character, 4 but is unlikely to hold for more highly structured polyimides.…”
Section: Resultsmentioning
confidence: 99%
“…It was not possible to fit the reflectance curves by a simple periodic electron density function and to retrieve the profile of the superlattice. [19] More insight into the structure of the thin films of 2 was obtained by transmission electron microscopy.…”
mentioning
confidence: 99%
“…7. 47,48 But the alkyl chains in our film are cross linked by polymerization. But as with the reflectivity, the transverse diffuse scattering varied only a little with temperature when the sample is in air.…”
Section: ͑9͒mentioning
confidence: 98%