2012
DOI: 10.1016/j.tsf.2012.04.018
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Null-ellipsometry investigations of the optical properties and diffusion processes in spin-valve structures based on Co and Cu

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“…Ellipsometry is a non-destructive technique, which allows for analysis of optical properties of thin films, including thickness and refractive index 29,64 . This technique depends on the changes in polarization state of the light, after reflecting from a thin film.…”
Section: Characterizationmentioning
confidence: 99%
“…Ellipsometry is a non-destructive technique, which allows for analysis of optical properties of thin films, including thickness and refractive index 29,64 . This technique depends on the changes in polarization state of the light, after reflecting from a thin film.…”
Section: Characterizationmentioning
confidence: 99%