Nuclei of dark spots in organic EL devices: detection by DFM and observation of the microstructure by TEM

Kawaharada, Miho; Ooishi, Mitsuma; Saito, Tetsuya; Hasegawa, Etsuo

doi:10.1016/s0379-6779(97)03989-1

Cited by 40 publications

(42 citation statements)

References 10 publications

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“…A completely different form of depth profiling is scanning of the device cross section with some surface-specific methods such as the scanning electron microscopy (SEM) or the scanning ion microscopy (SIM), where the contrast of the image may provide information about diffusion or migration processes. 196,200 …”

Section: Depth Profiling Techniquesmentioning

confidence: 99%

Degradation Mechanisms and Reactions in Organic Light-Emitting Devices

et al. 2015

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Section: Depth Profiling Techniquesmentioning

confidence: 99%

Degradation Mechanisms and Reactions in Organic Light-Emitting Devices

et al. 2015

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“…In this case spectroscopic methods such as scanning tunneling microscopy (STM) [12], transmission electron microscopy (TEM) [13], scanning electron microscopy (SEM) [14] and atomic force microscopy (ATM) [15] are used. Causes for device failures due to crystallization and inter diffusion of organic layers were reported by Adachi et al [16] and Han et al [17].…”

Section: Introductionmentioning

confidence: 99%

Investigation of FIrpic in PhOLEDs via LC/MS technique

et al. 2009

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Abstract:The commercial breakthrough of phosphorescent organic white light sources is presently hampered due to the unavailability of a stable blue phosphorescent emitter material. Moreover, only few analytical investigations have been made regarding the chemical degradation of the phosphorescent emitter materials during the processing or the operation of the devices. Organic light emitting devices (OLEDs) containing phosphorescent metal complexes with iridium as central ion were investigated. Special attention was paid to the chemical degradation of the material. The devices were analyzed by means of high performance liquid chromatography coupled with mass spectrometry (HPLC/MS). Electron spray ionization (ESI) was employed as ionization source. Isomerization phenomena of the blue-green emitting heteroleptic iridium complex FIrpic could be observed after the device manufacture and after operation. These findings could give hints on the mechanisms that influence the lifetime of PhOLEDs based on FIrpic or similar blue emitters.© Versita Warsaw and Springer-Verlag Berlin Heidelberg.

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“…Exposure to ambient conditions leads to the formation of nonemissive areas ͑dark spots͒ that result in a decrease in device luminescence. [2][3][4][5][6][7][8] Although the dark spots problem can be controlled by operating OLEDs in inert atmosphere, it is still of considerable practical interest to understand the details of the dark spots origins.…”

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confidence: 99%