2019
DOI: 10.1038/s41598-019-54907-3
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Novel Zeff imaging method for deep internal areas using back-scattered X-rays

Abstract: Elemental kinds, composition ratios, effective atomic number (Zeff), and spatial distributions are the most basic information on materials and determine the physical and chemical properties of materials. X-ray fluorescence analysis have conventionally been used for elemental mapping, however maps on deep internal areas cannot be obtained because the escape depth of fluorescence X-rays is limited to a few mm from the surface of samples. Herein, we present a novel Zeff imaging method that uses back-scattered X-r… Show more

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Cited by 5 publications
(2 citation statements)
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“…Achieving both high spectral and angular resolution over large solid angles, such as with a pnCCD detector 30 would enable additional maps of the sample structure to be obtained from the Compton and elastic scattering. For example, the ratio of elastic to inelastic scattering could be used to map the effective atomic number 31 , and diffraction tomography data 32 could be simultaneously measured by discriminating photons based on their energy.…”
Section: Discussionmentioning
confidence: 99%
“…Achieving both high spectral and angular resolution over large solid angles, such as with a pnCCD detector 30 would enable additional maps of the sample structure to be obtained from the Compton and elastic scattering. For example, the ratio of elastic to inelastic scattering could be used to map the effective atomic number 31 , and diffraction tomography data 32 could be simultaneously measured by discriminating photons based on their energy.…”
Section: Discussionmentioning
confidence: 99%
“…Achieving both high spectral and angular resolution over large solid angles, such as with a pnCCD detector 29 would enable additional maps of the sample structure to be obtained from the Compton and elastic scattering. For example, the ratio of elastic to inelastic scattering could be used to map the effective atomic number 30 , and diffraction tomography data 31 could be simultaneously measured by discriminating photons based on their energy.…”
Section: Discussionmentioning
confidence: 99%