Novel Test Infrastructure and Methodology Used for Accelerated Bring-Up and In-System Characterization of the Multi-Gigahertz Interfaces on the Cell Processor

Yeung, Philip; Torres, Alfonso; Batra, Priya

doi:10.1109/date.2007.364681

2007 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition 2007

DOI: 10.1109/date.2007.364681

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Novel Test Infrastructure and Methodology Used for Accelerated Bring-Up and In-System Characterization of the Multi-Gigahertz Interfaces on the Cell Processor

Philip Yeung

Alfonso Torres

Priya Batra

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Novel Test Infrastructure and Methodology Used for Accelerated Bring-Up and In-System Characterization of the Multi-Gigahertz Interfaces on the Cell Processor

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