Novel Test Generation Algorithm for Combination Circuits

Raahemifar, Kaamran; Ahmadi, M.

doi:10.1016/s0218-1266(00)00008-1

Cited by 1 publication

(1 citation statement)

References 7 publications

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“…Even though the dependence on the circuit inputs makes it impossible to predict the introduced latency, we stress that, assuming random inputs, the proposed method checks for faults every time an input / previous state combination that is a selected test vector appears. Empirical observations, as well as some theoretical analysis [12], indicate that, for random next state prediction logic, the ratio of such input / previous state combinations over all possible input combinations is significant. Additionally, we may reasonably assume that most "stuck-at" faults are detected by many input / previous state combinations.…”

Section: Discussionmentioning

confidence: 99%

Non-intrusive design of concurrently self-testable FSMs

Drineas

Makris

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).

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We propose a methodology for non-intrusive design of concurrently self-testable FSMs. The proposed method is similar to duplication, wherein a replica of the original FSM acts as a predictor that immediately detects potential faults by comparison to the original FSM. However, instead of duplicating the complete FSM, the proposed method replicates only a minimal portion adequate to detect all possible faults, yet at the cost of introducing potential fault detection latency. Furthermore, in contrast to concurrent error detection approaches, which presume the ability to resynthesize the FSM and exploit parity-based state encoding, the proposed method is non-intrusive and does not interfere with the encoding and implementation of the original FSM. Experimental results on FSMs of various sizes and densities indicate that the proposed method detects 100% of the faults with very low average fault detection latency. Furthermore, a hardware overhead reduction of up to 33% is achieved, as compared to duplication-based concurrent error detection.

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Section: Discussionmentioning

confidence: 99%

Non-intrusive design of concurrently self-testable FSMs

Drineas

Makris

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).

View full text Add to dashboard Cite

show abstract

Novel Test Generation Algorithm for Combination Circuits

Cited by 1 publication

References 7 publications

Non-intrusive design of concurrently self-testable FSMs

Non-intrusive design of concurrently self-testable FSMs

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