Novel Techniques for Noise-Tolerance in Combinational Critical-Path Circuit Components
Alaaeldin Hafez*,
Hanan A. Hosni Mahmoud
Abstract:The continued scaling of the device and interconnect in the deep submicron jurisdiction of the complementary metal oxide semiconductor (CMOS) very large scale design (VLSI) has brought many new design challenges and exposed the limitations of the traditional VLSI design. One of the most severe problems in the deep submicron is that the circuit tend to malfunction by producing incorrect outputs in the event of inputs that have glitch. Such noise problem has emerged as the critical reliability problem in the dee… Show more
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