Novel Methods for Bioimaging Including LA‐ICP‐MS , NanoSIMS , TEM / X‐EDS , and SXRF

Abstract

DOI: 10.1002/9783527694907.ch4International audienceThis chapter presents four complementary element-specific bioimaging techniques: laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS), nano secondary ion mass spectrometry (NanoSIMS), transmission electron microscopy coupled with energy-dispersive X-ray spectroscopy (TEM/X-EDS), and synchrotron-based X-ray fluorescence (SXRF). LA-ICP-MS is a spatially resolved analytical technique mainly measuring metallic elements in solidmaterials. LA-ICP-MS bioimaging analysis has been applied to cancer studies to investigate metal-ion distribution changes in diseased versus healthy tissues. SIMS is an analytical technique that relies on the sputtering of ions from a solid surface by focused positive or negative primary ion beams and the subsequent analysis of the produced secondary ions by a mass spectrometer under high vacuum. NanoSIMS and TEM/X-EDS are operated under high vacuum where the sample is exposed to a high-energy ion beam or electron beam. These facts demand specific sample preparation strategies for biological samples, which are similar for both techniques and can be regarded together

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“…In general, analysis by LA-ICP-MS starts with a laser beam focused on the sample surface to generate fine particles. 159 The ablated particles are then transported to the secondary excitation source of the ICP-MS instrument for ionization of the sampled mass. The excited ions in the plasma torch are subsequently introduced into a mass spectrometer detector for elemental and isotopic analysis.…”

“…Considering that laser spot size and irradiance differ significantly between standard imaging conditions and standard single spot analysis conditions, it is questionable whether both modes of laser ablation provide comparable quantitative results. 35 , 155 , 159 , 161 , 162 …”

“… 165 These studies converge with the existing techniques such as flow cytometry and fluorescence microscopy to meet the growing need to define cell biology and immunology on a cell-by-cell basis. 159 …”

“…Secondary ion mass spectrometry (SIMS) is another technique that provides information about the elemental and isotopic composition of samples in situ ; however, from a few micrometers to a sub-micron scale. 159 SIMS is based on ion sputtering from a solid surface by focused beams of positive or negative primary ion and the subsequent analysis of the produced secondary ions by a mass spectrometer under high vacuum. 159 Different combinations of primary ion sources ( e.g.…”

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“…Ion beam and X‐ray beam imaging techniques are powerful tools to study the isotopic and elemental composition of single cells (Ortega, Devès, & Carmona, ; Penen et al, ; Roschzttardtz et al, ; Sarret et al, ; Schaumlöffel et al, ). Nanoscale secondary ion mass spectrometry (NanoSIMS) allows elemental and isotopic mapping with a resolution of about 50 nm.…”