2015 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applicati 2015
DOI: 10.1109/civemsa.2015.7158628
|View full text |Cite
|
Sign up to set email alerts
|

Novel method for failure prognostics of power MOSFET

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
2
2

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 7 publications
0
1
0
Order By: Relevance
“…Xuerong Ye et al used a simulation-based health assessment methodology for SMPS [28]. Min Zhao et al made a proposal for failure prediction methodology for SMPS power MOSFET using an equivalent circuit model [29]. A major part of SMPS studies is based on a simulated model of the equivalent SMPS circuit, which requires a physics-of-failure modeling and mathematical knowledge of the SMPS.…”
Section: Motivation and Literature Reviewmentioning
confidence: 99%
“…Xuerong Ye et al used a simulation-based health assessment methodology for SMPS [28]. Min Zhao et al made a proposal for failure prediction methodology for SMPS power MOSFET using an equivalent circuit model [29]. A major part of SMPS studies is based on a simulated model of the equivalent SMPS circuit, which requires a physics-of-failure modeling and mathematical knowledge of the SMPS.…”
Section: Motivation and Literature Reviewmentioning
confidence: 99%