2015 IEEE 15th Mediterranean Microwave Symposium (MMS) 2015
DOI: 10.1109/mms.2015.7375420
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Novel illumination and parameter extraction technique for the characterization of multilayer structures in the GHz range with deep sub-wavelength resolution

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Cited by 3 publications
(7 citation statements)
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“…As such, TRM can be categorized as a special kind of Time Domain Reflectometry (TDR) method without the need for ultra-short pulses. To simultaneously extract the thickness, complex permittivity and complex permeability of each layer, a dual-frequency illumination trace is needed [21][22][23]. Periodic illumination is obtained by on-off keying a Single Pole Single Throw (SPST) switch arranged between the CW generator and the SUT [22,23].…”
Section: Measurement Methodologymentioning
confidence: 99%
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“…As such, TRM can be categorized as a special kind of Time Domain Reflectometry (TDR) method without the need for ultra-short pulses. To simultaneously extract the thickness, complex permittivity and complex permeability of each layer, a dual-frequency illumination trace is needed [21][22][23]. Periodic illumination is obtained by on-off keying a Single Pole Single Throw (SPST) switch arranged between the CW generator and the SUT [22,23].…”
Section: Measurement Methodologymentioning
confidence: 99%
“…We assume that the emitted waves are plane waves such that reflection and transmission properties at each interface can be easily derived. It is obvious from Figure 2b that the receiver will catch the nose of the reflection trace after the Round-Trip Time (RTT) and will continue to receive traces as long as the transmitter antenna is illuminating the SUT [21][22][23]. At each interface, the EMW energy will be divided into 2 parts, including reflection and transmission.…”
Section: Measurement Methodologymentioning
confidence: 99%
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