2006
DOI: 10.1007/s10854-006-6939-8
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Novel direct MOCVD growth of InxGa1−xAs and InP metamorphic layers on GaAs substrates

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Cited by 2 publications
(2 citation statements)
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“…From experimental results, it is found that the reduction ratio in I-V resistance is ~29.5% and turn-on voltage is ~8.5%, respectively. It can be resonably deduced that the thicker GaN buffer layer posseses fewer interface dislocation which results in the lower turn-on voltage [14]. During the device fabrication, we also use the ITO to replace the Ni/Au and investigate the influence of light output.…”
Section: Resultsmentioning
confidence: 99%
“…From experimental results, it is found that the reduction ratio in I-V resistance is ~29.5% and turn-on voltage is ~8.5%, respectively. It can be resonably deduced that the thicker GaN buffer layer posseses fewer interface dislocation which results in the lower turn-on voltage [14]. During the device fabrication, we also use the ITO to replace the Ni/Au and investigate the influence of light output.…”
Section: Resultsmentioning
confidence: 99%
“…The epitaxial films of the AlGaAs-GaAs based solar cell structures were grown in a MOCVD reactor [8]. MO-sources flow were separated to reduce undesirable parastic reaction.…”
Section: Methodsmentioning
confidence: 99%