Novel design and analysis procedures for differential-based filters on silicon

Darfeuille, Sébastien; Lintignat, Julien; Sassi, Zoheir; Barelaud, Bruno; Billonnet, Laurent; Jarry, Bernard; Marie, H.; Meunier, Philippe; Gamand, P.

doi:10.1002/mmce.20196

Cited by 4 publications

(1 citation statement)

References 8 publications

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“…The first category involves the forward and reverse noise measurements based on the concept of noise wave [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20][21][22]. The wave-based approach, first introduced by P. Penfield in [4], has been reviewed in details in [23] and therefore will not be discussed in this paper.…”

Section: Introductionmentioning

confidence: 99%

Accuracy Issues of on-Wafer Microwave Noise Measurements

Chen

2008

Fluct. Noise Lett.

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Communicated by François DannevilleThe accuracy issues of on-wafer noise characterization for a linear noisy two-port are presented in this paper. It starts with the description of a microwave noise measurement system and the possible source of error due to the microwave power meter in the measurement system. With the description of noise characterization techniques, this paper reviews a couple of methods for noise parameter extraction to handle the errors in the measured noise powers, noise factors, and source admittances. It also presents the methods to extract the physical noise parameters and to take care of different source admittances in the hot and cold states for accuracy enhancement.

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Section: Introductionmentioning

confidence: 99%

Accuracy Issues of on-Wafer Microwave Noise Measurements

Chen

2008

Fluct. Noise Lett.

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Thermal Noise Measurement and Characterization for Modern Semiconductor Devices

Chen¹

2021

IEEE Instrum. Meas. Mag.

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Wave-Based Approach for Microwave Noise Characterization

2008

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The noise behavior of a two-port is usually described through the conventional set of noise parameters Fmin, Rn, and the complex Yopt. However, noise parameters developed using wave-based techniques also have their merit as they could offer different insights to a two-port's noise behavior. Unlike the conventional noise parameters, these wave-based noise parameters could be terminal-invariant and describe only the intrinsic noise behavior of a two-port. In this paper, several important noise parameters derived from wave-based approaches are reviewed. The derivation of each set of parameters is discussed and illustrated. The measurement approach of each set of parameters is also briefly covered.

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Novel design and analysis procedures for differential-based filters on silicon

Abstract: In this paper, we present the design and realization of active recursive filters on Silicon employing differential circuits. A noise analysis method dedicated to the optimization of differential circuits is also introduced.

Cited by 4 publications

References 8 publications

Accuracy Issues of on-Wafer Microwave Noise Measurements

Accuracy Issues of on-Wafer Microwave Noise Measurements

Thermal Noise Measurement and Characterization for Modern Semiconductor Devices

Wave-Based Approach for Microwave Noise Characterization

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