2013
DOI: 10.1088/0957-0233/24/8/085901
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Novel correction methods on a miniature tensile device based on a modular non-standard layout

Abstract: A novel in situ tensile device with a large output load–volume ratio was developed for testing the mechanical properties of bulk materials. A major characteristic of the device was the modular non-standard layout, as the specimen was placed on the top plane of the device to approach the lens of an optical microscope or the electron gun of a scanning electron microscope. Accordingly, to investigate the effects of non-standard layout on tensile properties, displacement and load correction methods were given by f… Show more

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Cited by 14 publications
(13 citation statements)
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References 32 publications
(44 reference statements)
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“…During the three-point bending testing, a uniaxial bending load is continuously applied on a carefully prepared specimen and the corresponding deflection is recorded. Therefore, the testing device's stiffness and the veracity of deflection are required to be taken into account [8,9]. Many attempts have been made to carry out the bending tests on function materials [10], semiconductor materials [5,11] and structure materials [1,2,7], such as Fist et al [5], who proposed a three-point bending device to study the vibrational response of ZrB 2 + SiC and LaCoO 3 ceramics.…”
Section: Introductionmentioning
confidence: 99%
“…During the three-point bending testing, a uniaxial bending load is continuously applied on a carefully prepared specimen and the corresponding deflection is recorded. Therefore, the testing device's stiffness and the veracity of deflection are required to be taken into account [8,9]. Many attempts have been made to carry out the bending tests on function materials [10], semiconductor materials [5,11] and structure materials [1,2,7], such as Fist et al [5], who proposed a three-point bending device to study the vibrational response of ZrB 2 + SiC and LaCoO 3 ceramics.…”
Section: Introductionmentioning
confidence: 99%
“…Young's modulus measured by uniax ial tensile testing is affected by many inevitable factors, such as misalignment of the tensile axis [6][7][8][9], initial residual stress [10] and clamping position [4]. Regarding the effects of these factors on the testing accuracy of Young's modulus, relevant theoretical models [8,11,12] and correcting methods [4,13] have been established and have provided references for the accurate calcul ation and error calibration of Young's modulus of bulk materials. However, regarding microsized specimens, because the clamp ing and measurement methods of load and displacement are dif ferent [14], these models and methods might not be appropriate.…”
Section: Introductionmentioning
confidence: 99%
“…In addition, in situ tensile testing under scanning/transmission Measurement error of Young's modulus considering the gravity and thermal expansion of thin specimens for in situ tensile testing Zhichao Ma 1,2 , Hongwei Zhao 1,3 and Luquan Ren 2 electron microscopes (SEM/TEM) or optical microscopes is beneficial for understanding the failure mechanism of materials and could be used to investigate the relation between the evol ution behaviors of microstructure and mechanical properties [4,15]. At present, most miniature in situ tensile devices compat ible with SEM/TEM or optical microscopes adopt a horizon tal layout [13]. On one hand, under optical imaging conditions, the imaging quality is very sensitive to the distance between the lens and the specimen's upper surface, on the other hand, the gravity of the specimen would not only cause a deflection at the midpoint but also affect the initial gage length of the specimen.…”
Section: Introductionmentioning
confidence: 99%
“…Micro-electromechanical-based sensor (MEMS) devices allow short response time and high sensitivity. Cheap and fast production of these devices is the result of progress in micro-technology in the last decade [8][9][10].…”
Section: Introductionmentioning
confidence: 99%