Notice of Violation of IEEE Publication Principles: Selective Triple Modular Redundancy for Single Event Upset (SEU) Mitigation

She, Xiaoxuan; Samudrala, P.K.

doi:10.1109/ahs.2009.9

Cited by 22 publications

(2 citation statements)

References 27 publications

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“…The literature reports the output of research showing alternative methods to TMR or TMR/Simplex, which have better reliability and reduced overhead costs [24,25]. However, excluding Lima's [26] hybrid method, which has been shown to provide reliability benefits equivalent to those of TMR at a lower cost, no other method has been reported in the literature.…”

Section: Introductionmentioning

confidence: 99%

A High-Reliability Redundancy Scheme for Design of Radiation-Tolerant Half-Duty Limited DC-DC Converters

et al. 2021

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Redundancy techniques are commonly used to design radiation- and fault-tolerant circuits for space applications, to ensure high reliability. However, higher reliability often comes at a cost of increased usage of hardware resources. Triple Modular Redundancy (TMR) ensures full single fault masking, with a >200% power and area overhead cost. TMR/Simplex ensures full single fault masking with a slightly more complicated circuitry, inefficient use of resource and a >200% power and area overhead cost, but with higher reliability than that of TMR. In this work, a high-reliability Spatial and Time Redundancy (TR) hybrid technique, which does not abandon a working module and is applicable for radiation hardening of half-duty limited DC-DC converters, is proposed and applied to the design of a radiation-tolerant digital controller for a Dual-Switch Forward Converter. The technique has the potential of double fault masking with a <2% increase in resource overhead cost compared to TMR. Moreover, for a Simplex module failure rate, λ, of 5%, the Reliability Improvement Factor (RIF) over the Simplex system is 20.8 and 500 for the proposed technique’s two- and three-module implementations, respectively, compared to a RIF over the Simplex system of only 7.25 for TMR and 14.3 for the regular TMR/Simplex scheme.

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Section: Introductionmentioning

confidence: 99%

A High-Reliability Redundancy Scheme for Design of Radiation-Tolerant Half-Duty Limited DC-DC Converters

et al. 2021

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“…For SEU mitigation, triple modular redundancy (TMR) is widely accepted in mission-critical applications. Recently selective triple modular redundancy (selective TMR) is attracting attentions in the areas where both reliability and cost should be considered [5], [6]. In selective TMR, some components in a given circuit are selectively triplicated when a design constraint (e.g., area) does not allow triplicating all the components.…”

Section: Introductionmentioning

confidence: 99%

A Cost-Effective Selective TMR for Coarse-Grained Reconfigurable Architectures Based on DFG-Level Vulnerability Analysis

Imagawa

Tsutsui

Ochi

et al. 2013

IEICE Trans. Electron.

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Takashi IMAGAWA †a) , Nonmember, Hiroshi TSUTSUI †b) , Hiroyuki OCHI †c) , and Takashi SATO †d) , Members SUMMARYThis paper proposes a novel method to determine a priority for applying selective triple modular redundancy (selective TMR) against single event upset (SEU) to achieve cost-effective reliable implementation of application circuits onto coarse-grained reconfigurable architectures (CGRAs). The priority is determined by an estimation of the vulnerability of each node in the data flow graph (DFG) of the application circuit. The estimation is based on a weighted sum of the node parameters which characterize impact of the SEU in the node on the output data. This method does not require time-consuming placement-and-routing processes, as well as extensive fault simulations for various triplicating patterns, which allows us to identify the set of nodes to be triplicated for minimizing the vulnerability under given area constraint at the early stage of design flow. Therefore, the proposed method enables us efficient design space exploration of reliability-oriented CGRAs and their applications. key words: soft error, single event upset, triple modular redundancy, reliability, simulated annealing

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Design considerations for reliable embedded systems

Shafik

Das

Yang

et al. 2015

Reliability Characterisation of Electrical and Electronic Systems

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Notice of Violation of IEEE Publication Principles: Selective Triple Modular Redundancy for Single Event Upset (SEU) Mitigation

Cited by 22 publications

References 27 publications

A High-Reliability Redundancy Scheme for Design of Radiation-Tolerant Half-Duty Limited DC-DC Converters

A High-Reliability Redundancy Scheme for Design of Radiation-Tolerant Half-Duty Limited DC-DC Converters

A Cost-Effective Selective TMR for Coarse-Grained Reconfigurable Architectures Based on DFG-Level Vulnerability Analysis

Design considerations for reliable embedded systems

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