Note: Submicrometer-precision sample holder for accurate re-positioning of samples in scanning force microscopy

Abstract

In this work we describe two simple and compact submicrometer-precision sample holders that are easily integrated into a Scanning Force Microscopy (SFM) system. The designs are based on a traditional kinematic mounting or on self-adjustment of the sample holder and the upper piece of the piezoelectric scanner. With these sample holders the sample position is automatically recovered to within about 100 nm. The setup allows ex situ manipulation of the sample and SFM imaging of the same region without the aid of an optical microscope, positioning marks, and tedious re-allocation.

Metal‐conducting polymer interface studied by Kelvin probe microscopy: Au and Al on poly(3‐octyl‐thiophene)

“…After each evaporation step the sample was performed of the vacuum chamber to be characterized by dynamic scanning force microscopy (DSFM). To find the same surface location after sample removal a micron‐precision sample holder integrated in the SFM system has been developed by our group . This sample holder allows ex‐situ manipulation of the sample and SFM imaging of the same region with submicrometer resolution.…”