2018
DOI: 10.1063/1.5008807
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Note: Improvement of the 3ω thermal conductivity measurement technique for its application at the nanoscale

Abstract: The reduction of the thermal conductivity in nanostructures opens up the possibility of exploiting for thermoelectric purposes also materials such as silicon, which are cheap, available and sustainable but with a high thermal conductivity in their bulk form. The development of thermoelectric devices based on these innovative materials requires reliable techniques for the measurement of thermal conductivity on a nanometric scale. The approximations introduced by conventional techniques for thermal conductivity … Show more

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Cited by 13 publications
(9 citation statements)
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“…For the proper application of the 3ω technique it is essential to choose the correct model for data reduction. Although an analytical model has been developed for 2D structures [23] (thin membranes), in our case we have fitted the data by means of an approach based on FEM (Finite Element Method) simulations that we have developed [24], using the thermal conductivity as a fitting parameter. The simulation takes into account the thermoelectric transport in the metal and in the silicon nanostructures, considering the measured electrical conductivities.…”
Section: Device Fabricationmentioning
confidence: 99%
“…For the proper application of the 3ω technique it is essential to choose the correct model for data reduction. Although an analytical model has been developed for 2D structures [23] (thin membranes), in our case we have fitted the data by means of an approach based on FEM (Finite Element Method) simulations that we have developed [24], using the thermal conductivity as a fitting parameter. The simulation takes into account the thermoelectric transport in the metal and in the silicon nanostructures, considering the measured electrical conductivities.…”
Section: Device Fabricationmentioning
confidence: 99%
“…In the specific case of this work, the fabricated devices can be used for the measurement of the thermal conductivity of the grids of nanostructures. Future work will consist in applying an all-electrical technique, such as the three ω method [13], for thermal conductivity measurement: to this end, it will be exploited the Joule heating achieved by the bias of the metal resistor fabricated at the center of the grids. Moreover, the fabrication process will be improved to achieve nanostructures 100 nm wide and 1 µm tall.…”
Section: Discussion and Future Workmentioning
confidence: 99%
“…The electrical conductivity was calculated from the measured values of resistance ( R ) and the morphological data of the NW, from room temperature to 620 K. Thermal conductivity measurements were performed with AC measurements, applying the 3ω method, and using a Standford Research SR830 Lock‐in amplifier for acquiring the third harmonic signal and as the voltage output source. [ 92 ] A balance resistor in series with the NW was used for current control (Figure S9, Supporting Information). [ 93 ] Further details on the approaches followed and on the set‐up are given in Supporting Information Section S6.…”
Section: Methodsmentioning
confidence: 99%