2006
DOI: 10.1063/1.2398923
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Normal and inverse current-induced magnetization switching in a single nanopillar

Abstract: The authors report on current-induced magnetization switching ͑CIMS͒ in single-crystalline nanopillars. Fe͑14 nm͒ /Cr͑0.9 nm͒ /Fe͑10 nm͒ /Ag͑6 nm͒ /Fe͑2 nm͒ multilayers are deposited by molecular-beam epitaxy. The central Fe layer is coupled to the thick one by interlayer exchange coupling over Cr, while the topmost Fe layer is decoupled. Nanopillars with 150 nm diameter are prepared by optical and e-beam lithographies. The opposite spin scattering asymmetries of the Fe/ Cr and Fe/ Ag interfaces enabled the au… Show more

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Cited by 20 publications
(25 citation statements)
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“…In our convention, a positive current corresponds to an electron flow from the nanomagnet to the extended layer. In previous experiments with Fe/Ag/Fe pillars 11,15,16 we have established that the spin-transfer torque due to a positive current acts toward an antiparallel alignment. Therefore, the high-resistive state can be identified in terms of antiparallel aligned uniform magnetizations and the low-resistive state as the vortex state.…”
mentioning
confidence: 99%
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“…In our convention, a positive current corresponds to an electron flow from the nanomagnet to the extended layer. In previous experiments with Fe/Ag/Fe pillars 11,15,16 we have established that the spin-transfer torque due to a positive current acts toward an antiparallel alignment. Therefore, the high-resistive state can be identified in terms of antiparallel aligned uniform magnetizations and the low-resistive state as the vortex state.…”
mentioning
confidence: 99%
“…Finally, Ti 15 nm/Au 200 nm top electrodes are formed by optical lithography, thermal evaporation, and lift-off technique. 11 Using this process we fabricate nanomagnets of 230 nm diameter and 20 nm thickness, which are separated by 6 nm Ag from an extended 2-nm-thick Fe layer ͓see inset in Fig. 1͑a͔͒.…”
mentioning
confidence: 99%
“…Here we deal with top and bottom contacted, sub-micron-sized nanopillars made from multilayer stacks comprising ferromagnetic and non-magnetic materials for the study of current-induced magnetization dynamics. We show how the charging effects in a previously established fabrication process for single-crystalline nanopillars by H. Dassow et al (2006) [1] can be significantly reduced by using the bottom electrode layer as charge dissipater and only isolating and disconnecting the bottom electrodes from ground after the fabrication of the delicate nanopillar structure by electron beam lithography. The modified process is successfully applied to Co 2 MnSi/Ag/Co 2 MnSi(001) multilayer stacks grown on highly insulating MgO substrates.…”
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confidence: 99%
“…This kind of structures are interesting model systems, which we are also employing to investigate current-induced magnetization switching. 34 The preparation is described in detail elsewhere. 34 The Cr thickness has been chosen in order to obtain a strong antiferromagnetic coupling in the bottom Fe/Cr/Fe trilayer, which fixes the center reference layer.…”
Section: A Sample Preparation and Experimental Setupmentioning
confidence: 99%
“…34 The preparation is described in detail elsewhere. 34 The Cr thickness has been chosen in order to obtain a strong antiferromagnetic coupling in the bottom Fe/Cr/Fe trilayer, which fixes the center reference layer. The top, thin Fe layer is decoupled and can be switched more easily by an external field or a perpendicularly applied current.…”
Section: A Sample Preparation and Experimental Setupmentioning
confidence: 99%