2010
DOI: 10.1063/1.3297878
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Nonvolatile nano-floating gate memory devices based on pentacene semiconductors and organic tunneling insulator layers

Abstract: Controlled gold nanoparticle (AuNP)-based nonvolatile memory devices were developed based on pentacene organic transistors and polymethylmethacrylate (PMMA) insulator layers. The memory device had the following configuration: n+Si gate/SiO2 blocking oxide/polyelectrolytes/AuNP/PMMA tunneling dielectric layer/Au source-drain. According to the programming/erasing operations, the memory device showed good programmable memory characteristics with a large memory window. In addition, good reliability was confirmed b… Show more

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Cited by 97 publications
(57 citation statements)
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“…Their group also reported the use of PMMA as the tunnelling dielectric layer (Fig. 7a) [56]. In that case, a very large memory window (~34 V) was obtained (Fig.…”
Section: Mos Field-effect Transistor-type Memory Devicesmentioning
confidence: 96%
“…Their group also reported the use of PMMA as the tunnelling dielectric layer (Fig. 7a) [56]. In that case, a very large memory window (~34 V) was obtained (Fig.…”
Section: Mos Field-effect Transistor-type Memory Devicesmentioning
confidence: 96%
“…2 Organic materials have received much attention due to their flexibility, ease of production, and low cost. [3][4][5][6][7][8] Those materials have applications in different fields such as organic solar cells, 5 organic light-emitting diodes (OLEDs), 6 sensors, and organic thin-film transistors (OTFTs). 3,7,8 Investigations on organic memory devices were established in the late 1950s; however, further experimental and theoretical studies are still needed to enhance their efficiency.…”
Section: Introductionmentioning
confidence: 99%
“…A self-assembled multilayer of polyelectrolytes, together with a thin spin-coated poly(4-vinyl phenol) (PVP) layer, covers the gold nanoparticles and separates them from the poly(3-hexylthiophene) (P3HT) channel. The memory transistor has an on/off ratio of over 1500 and a data retention time of about 200 s. Recently, Kim et al used PMMA as a tunneling dielectric layer; the resulting memory devices exhibited a maximum memory window of 34 V with a programming voltage of 80 V [24]. The data retention measurements suggested that the memory properties could be maintained for more than 1 year.…”
Section: Floating Gate Ofet Memorymentioning
confidence: 94%