2022
DOI: 10.1002/aelm.202200958
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Nonvolatile Electrochemical Random‐Access Memory under Short Circuit

Abstract: gate memory, [6] phase-change memory (PCM), [7][8][9] ferroelectric transistors, [10,11] resistive redox memory (ReRAM), [12][13][14][15][16][17] and magnetic tunnel junction memory. [18] Unfortunately, none of these technologies have been able to meet all the demands of in-memory computing.Electrochemical random-access memory, or ECRAM, is a promising recently developed device for analog inmemory computing. ECRAM stores analog information states by electrochemically shuttling guest dopant ions like lithium i… Show more

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Cited by 10 publications
(7 citation statements)
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“…Another potential area of impact might be the design of materials for emerging electrochemical ionic synaptic devices, , where the coupled ionic and electronic transfer (CIET) governs the operation speed. Inducing phase transition has been shown to be an effective method for improving the performance of the devices, which makes it essential to understand the link between phase transition and interfacial CIET. Therefore, we conclude that our findings pave the way toward a deeper understanding of phase-specific kinetics and reaction mechanisms for a variety of electrochemical interfaces.…”
Section: Discussionmentioning
confidence: 99%
“…Another potential area of impact might be the design of materials for emerging electrochemical ionic synaptic devices, , where the coupled ionic and electronic transfer (CIET) governs the operation speed. Inducing phase transition has been shown to be an effective method for improving the performance of the devices, which makes it essential to understand the link between phase transition and interfacial CIET. Therefore, we conclude that our findings pave the way toward a deeper understanding of phase-specific kinetics and reaction mechanisms for a variety of electrochemical interfaces.…”
Section: Discussionmentioning
confidence: 99%
“…Previously, we demonstrated a retention of ≈3 h for TiO x ECRAM that utilizes YSZ solid electrolyte (Li et al, 2020b). More recently, we demonstrated in collaboration with Y. Li’s group at the University of Michigan that a retention of ≈10 years is feasible for WO 3-x /YSZ ECRAM, as shown in Figure 20 (Kim et al, 2022).
Figure 20.ECRAM device.
…”
Section: Devicesmentioning
confidence: 99%
“…(d) Comparison of retention times of WO 3-x ECRAM with filament-based ReRAM and past TiO x -based ECRAM. (Kim et al, 2022). Copyright 2022, Wiley.…”
Section: Devicesmentioning
confidence: 99%
“…This is attributed to slow oxidation of the channel by oxygen in air, even when HfO 2 passivation layers are used to protect the device from the atmosphere. [ 35 ] Furthermore, O‐EIS devices typically must be operated either using high voltages [ 26,28,31 ] or at elevated temperatures [ 29,35 ] to overcome the high activation energies for O 2− ion migration.…”
Section: Introductionmentioning
confidence: 99%