2016
DOI: 10.1039/c6ra11615a
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Nonvolatile electrical switching behavior and mechanism of functional polyimides bearing a pyrrole unit: influence of different side groups

Abstract: Influence of side groups to the nonvolatile electrical switching behaviors and its mechanism of polyimides bearing pyrrole unit were systematically studied.

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Cited by 9 publications
(3 citation statements)
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“…Meanwhile, the electric field induced “conformation‐coupled charge transfer” could be also used to explain the nonvolatile WORM memory performance . Due to donor moieties were covalently linked with acceptor moieties by single‐bonded, under an applied field, the formation the excited state in the PI system could produce the conformation coupled charge transfer process.…”
Section: Resultsmentioning
confidence: 99%
“…Meanwhile, the electric field induced “conformation‐coupled charge transfer” could be also used to explain the nonvolatile WORM memory performance . Due to donor moieties were covalently linked with acceptor moieties by single‐bonded, under an applied field, the formation the excited state in the PI system could produce the conformation coupled charge transfer process.…”
Section: Resultsmentioning
confidence: 99%
“…Up to now, through the polycondensation reactions of different electron-donating (D) moieties containing triphenylamine, [10][11][12] , carbazole, [11][12][13][14] ferrocene, 15 pyrrole, 16 oxadiazole, 17 triazole, 18 porphyrin, 19,20 and thiophene, 21 with the electron-accepting (A) moieties, functional PIs with multifarious memory deeds, involving dynamic random access memory (DRAM), 20 static random access memory (SRAM), 17 flash, 15,22 and write-once read-many-times memory (WORM), 16,23 have been wide researched. Meanwhile, molecular structure could be regulated through the introduction of flexible linkages, 24,25 fluorine atoms, 26 bulky pendant groups, 27 and unsymmetrical units.…”
Section: Introductionmentioning
confidence: 99%
“…Up to now, Ar-PIs have been reported to exhibit resistive switching characteristics in memory devices, including the nonvolatile “write once–read many” (WORM) memory, , flash memory, , volatile dynamic random access memory (DRAM), , and static random access memory (SRAM). , The Ar–PI-based resistive memory devices record data based on the low and high conductivity response under an applied voltage, in which the conductive mechanism of Ar-PIs is related to the field-induced CT formation . However, to our knowledge, most of these reported Ar-PIs are usually nonluminescent or exhibit low PLQY and ignore the relationship between the EL behavior and resistive switching behavior.…”
mentioning
confidence: 99%