1987
DOI: 10.1016/0168-583x(87)90298-9
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Nonpolynomial approximation of background in X-ray spectra

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Cited by 27 publications
(8 citation statements)
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“…Basically, it consists of a linear or non-linear intensity addition which results in a distorted measurement, whereby the observed value is higher than its real value. Multiple algorithms have been proposed to deal with the estimation and correction of baseline effects, [23][24][25][26][27][28][29][30] and the fundamentals of operation of these baseline methods is beyond the scope of this paper. After a series of preliminary experiments, it was decided to use the ALS algorithm [23] which offered the best results for the spectral data recorded in this work.…”
Section: Baselinementioning
confidence: 99%
“…Basically, it consists of a linear or non-linear intensity addition which results in a distorted measurement, whereby the observed value is higher than its real value. Multiple algorithms have been proposed to deal with the estimation and correction of baseline effects, [23][24][25][26][27][28][29][30] and the fundamentals of operation of these baseline methods is beyond the scope of this paper. After a series of preliminary experiments, it was decided to use the ALS algorithm [23] which offered the best results for the spectral data recorded in this work.…”
Section: Baselinementioning
confidence: 99%
“…Wavelet transform 12 was used to filter out the baseline in open-path FT-IR spectra (OP/FT-IR). Kajfosz and Kwiatek 13 modeled the baseline in X-ray spectra, such as from XRF, PIXE, and SRIXE, using the envelope of parabolas placed above and below the spectrum. The rolling ball method 14 and the correction method presented in Parente 15 are similarly based on fitting the envelope of ellipses and Hermite polynomials, respectively.…”
Section: Introductionmentioning
confidence: 99%
“…In the past two decades, many automated solutions to the baseline removal problem have been proposed for different applications. [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15] Commonly, these methods have multiple adjustable parameters that must be tuned to the user's specific data and task. Identifying their optimal values is often a time-consuming process.…”
Section: Introductionmentioning
confidence: 99%
“…Induced X-rays were measured with the ORTEC Si(Li) semiconductor detector with resolution c. 200 eV. The data reduction was performed witb a software package developed for thick target analysis Kajfosz and Kwiatek, 1987).…”
Section: Materials and Methods Of Investigationmentioning
confidence: 99%
“…The resolution of the detector at 6.4 keV was c. 170 eV. Emission spectra were processed using the least-squares method of with backgrounds cut using nonpolynomial approximation (Kajfosz and Kwiatek, 1987). 30 EPMA measurements were used to calibrate against an internal Fe standard.…”
Section: Au and Pge In Black Shale 105mentioning
confidence: 99%