1986
DOI: 10.1016/0168-9002(86)91033-8
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Nonlinear response of Si detectors for low-Z ions

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Cited by 81 publications
(23 citation statements)
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“…We note, however, that the TRIM predictions are about 10 keV below the calculations presented in Ref. [39]. As pointed out in Ref.…”
Section: E Nonlinear Response At Low Energymentioning
confidence: 47%
See 1 more Smart Citation
“…We note, however, that the TRIM predictions are about 10 keV below the calculations presented in Ref. [39]. As pointed out in Ref.…”
Section: E Nonlinear Response At Low Energymentioning
confidence: 47%
“…6) and the 1.4% pulse height defect given in Ref. [39,40]. A dedicated analysis of the 23 Al data will be published separately [41].…”
Section: E Nonlinear Response At Low Energymentioning
confidence: 99%
“…SRIM range tables [30] were used to correct for energy losses in the source and the detector deadlayers, taking into account the varying effective thickness due to the angle of incidence and assuming a point-like source. Corrections were also made for the non-ionizing energy loss [31] in the active detector volume, i.e., the energy loss that does not contribute to the measured signal. The source thickness was determined to be 100(4) nm carbon equivalent by rotating the source relative to the detector while monitoring the rate of change of pulse height with angle.…”
Section: Energy Calibrationmentioning
confidence: 99%
“…Both parts of the stopping power will differ for protons and α-particles and this effect can be corrected for as described in Ref. [10]. Accordingly, the energy calibration can be transformed by first correcting the energy deposited in the detector for the difference in the non-ionizing energy lost for the two types of particles.…”
Section: Energy Calibrationmentioning
confidence: 99%