2019
DOI: 10.1109/ted.2018.2888870
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Nonlinear Electrothermal Model for Investigating Transient Temperature Responses of a Through-Silicon Via Array Applied With Gaussian Pulses in 3-D IC

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Cited by 12 publications
(3 citation statements)
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“…For temporal discretization, several numerical methods have been used for the transient thermal analysis of 3-D ICs [26], [27]. Among them, the typical explicit time methods include: forward Euler method [19] and leapfrog method [23].…”
Section: Introductionmentioning
confidence: 99%
“…For temporal discretization, several numerical methods have been used for the transient thermal analysis of 3-D ICs [26], [27]. Among them, the typical explicit time methods include: forward Euler method [19] and leapfrog method [23].…”
Section: Introductionmentioning
confidence: 99%
“…With the increase of the integration of the electronic components, Joule heat of the circuits becomes a severe problem; sometimes, it will lead to the decline of the reliability of the circuit [1,2]. In order to solve this problem, the variation of the electromagnetic component parameters with the temperature [1][2][3][4], the distribution of the temperature in the circuit [5][6][7], and the influence of the high temperature on circuit performance [1,2,8] arouse the researchers' study interests to guide circuit design and improve its stability. The difficulty of this study is that the electricity is the cause of the Joule heat, and the heat will affect the electrical parameters in return.…”
Section: Introductionmentioning
confidence: 99%
“…In 2019, a 3D RPIM was presented to study the temperature response from a through-silicon via (TSV). And the effects of the σ , K, and the specific heat C were taken into account [7]. Whereas, the problem of meshless algorithm, which we mentioned earlier, still needs to be faced.…”
Section: Introductionmentioning
confidence: 99%