Nonlinear Correction Method for Si Photodiode Detectors and Its Application to the Electro-Optical Measurement for the PDLC Film

Abstract

A corrected measurement method based on the silicon photodiode detector was investigated.The silicon photodiode detector is a fast response, but the measured transmittance error between the light power meter occurs and depends on the incident light power. In our work, the nonlinear empirical formula was derived from the measured results of the silicon photodiode detector and light power meter. In addition, the formula was used to correct the measuring results of the polymer dispersed liquid crystal, and the corrected results are identical to those of the light power meter. The experimental results further show that the silicon photodiode detector is faster than the light power meter when measuring electro-optical response. As a result, the corrected method is reliable.