Abstract:The dark bridge in loose electrical contacts was investigated, which grew up when the contact gap was increased a little with micron by micron. The dark bridge was watched by microscopic camera along with measurement of voltage-current (V-I) relationship. At very small gap (less than 19µm for iron (Fe) contacts but different from materials), the V-I characteristics were linear, which is normal, but more than the 20~30µm, the non-linear relationship appeared and finally the negative resistance was observed. Exp… Show more
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