Our system is currently under heavy load due to increased usage. We're actively working on upgrades to improve performance. Thank you for your patience.
2009
DOI: 10.1103/physreva.80.040902
|View full text |Cite
|
Sign up to set email alerts
|

Noninvasive electron microscopy with interaction-free quantum measurements

Abstract: We propose the use of interaction-free quantum measurements with electrons to eliminate sample damage in electron microscopy. This might allow noninvasive molecular-resolution imaging. We show the possibility of such measurements in the presence of experimentally measured quantum decoherence rates and using a scheme based on existing charged particle trapping techniques.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
85
0

Year Published

2010
2010
2024
2024

Publication Types

Select...
7
1
1

Relationship

0
9

Authors

Journals

citations
Cited by 114 publications
(85 citation statements)
references
References 19 publications
0
85
0
Order By: Relevance
“…Hence, reducing sample damage is crucial for future developments of electron microscopy. Next to other proposals [3], a quantum-mechanical protocol called "interaction-free measurement" (IFM), previously proven to work with photons [4,5], has been suggested as a means to this end [6]. The basic idea of interaction-free measurements is to exploit the wave-like features of quantum particles in order to gain information about an object while reducing the interaction between particle and object to a minimum.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Hence, reducing sample damage is crucial for future developments of electron microscopy. Next to other proposals [3], a quantum-mechanical protocol called "interaction-free measurement" (IFM), previously proven to work with photons [4,5], has been suggested as a means to this end [6]. The basic idea of interaction-free measurements is to exploit the wave-like features of quantum particles in order to gain information about an object while reducing the interaction between particle and object to a minimum.…”
Section: Introductionmentioning
confidence: 99%
“…Hence, such measurement schemes have sometimes also been called "absorption-free" measurements [15]. Especially if other probe particles like electrons [6] or neutrons [18] are considered, however, it should be noted that IFMs are not only absorption free but are also free of any process that prevents the probe particle's wave function from continuing undisturbed on its original path. Scattering out of the path or momentum-changing collisions turn out to have the same effect as absorption.…”
Section: Introductionmentioning
confidence: 99%
“…New approaches and tools are critical to advance. An exceptional development has occurred in electron microscopy that may allow the noninvasive molecular-resolution imaging of live samples ( Figure 6) [31]. Usually electron microscopy is a destructive technique as the electron beam may destroy the sample in the process of inspecting it.…”
Section: Whole Cell Characterizationmentioning
confidence: 99%
“…This can be observed in decoherence studies of electrons near semiconducting surfaces [5] and developments such as a field emission source for free electron femtosecond pulses [6,7], surface-electrode chips [8] or a biprism electron interferometer with a single atom tip source [9]. New quantum devices with coherent electrons are currently implemented like a recently proposed noninvasive quantum electron microscope [10]. Due to the quantum Zeno effect it potentially reduces the electron radiation exposure during scanning of fragile biological samples by two orders of magnitude.…”
Section: Introductionmentioning
confidence: 99%